P

Inventor

KANNO SEIICHIRO

JP43 patents
⚠️ This page may combine multiple inventors who share the name “KANNO SEIICHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI HIGH TECH CORP

25 patents
US6646233B2Nov 11, 2003

Wafer stage for wafer processing apparatus and wafer processing method

HITACHI HIGH TECH CORP89 citations98
US7138606B2Nov 21, 2006

Wafer processing method

HITACHI HIGH TECH CORP53 citations96
US6895179B2May 17, 2005

Wafer stage for wafer processing apparatus

HITACHI HIGH TECH CORP37 citations92
US6825617B2Nov 30, 2004

Semiconductor processing apparatus

HITACHI HIGH TECH CORP37 citations92
US6677167B2Jan 13, 2004

Wafer processing apparatus and a wafer stage and a wafer processing method

HITACHI HIGH TECH CORP39 citations92
US7931776B2Apr 26, 2011

Plasma processing apparatus

HITACHI HIGH TECH CORP8 citations84
US7396771B2Jul 8, 2008

Plasma etching apparatus and plasma etching method

HITACHI HIGH TECH CORP15 citations84
US10872742B2Dec 22, 2020

Charged particle beam device

HITACHI HIGH TECH CORP8 citations83
US7771564B2Aug 10, 2010

Plasma processing apparatus

HITACHI HIGH TECH CORP10 citations83
US10790111B2Sep 29, 2020

Charged-particle beam device

HITACHI HIGH TECH CORP2 citations72
US9543113B2Jan 10, 2017

Charged-particle beam device for irradiating a charged particle beam on a sample

HITACHI HIGH TECH CORP2 citations72
US9601307B2Mar 21, 2017

Charged particle radiation apparatus

HITACHI HIGH TECH CORP4 citations71
US9401297B2Jul 26, 2016

Electrostatic chuck mechanism and charged particle beam apparatus

HITACHI HIGH TECH CORP5 citations70
US7567422B2Jul 28, 2009

Plasma processing apparatus and plasma processing method

HITACHI HIGH TECH CORP6 citations63
US7183715B2Feb 27, 2007

Method for operating a semiconductor processing apparatus

HITACHI HIGH TECH CORP2 citations63
US11735394B2Aug 22, 2023

Charged particle beam apparatus

HITACHI HIGH TECH CORP1 citations62
US10903036B2Jan 26, 2021

Charged-particle beam device

HITACHI HIGH TECH CORP0 citations62
US7838792B2Nov 23, 2010

Plasma processing apparatus capable of adjusting temperature of sample stand

HITACHI HIGH TECH CORP4 citations62
US9105446B2Aug 11, 2015

Charged particle beam apparatus

HITACHI HIGH TECH CORP2 citations61
US12211665B2Jan 28, 2025

Charged particle beam device

HITACHI HIGH TECH CORP0 citations60
US12106930B2Oct 1, 2024

Charged particle beam device

HITACHI HIGH TECH CORP1 citations60
US11929231B2Mar 12, 2024

Charged particle beam device

HITACHI HIGH TECH CORP0 citations60
US11335533B2May 17, 2022

Charged particle beam device

HITACHI HIGH TECH CORP0 citations60
US9666408B2May 30, 2017

Apparatus and method for processing sample, and charged particle radiation apparatus

HITACHI HIGH TECH CORP1 citations52
US9799486B2Oct 24, 2017

Charged particle beam apparatus for measuring surface potential of a sample

HITACHI HIGH TECH CORP0 citations41

HITACHI LTD

11 patents

MIYA GO

2 patents

KANNO SEIICHIRO

2 patents

KITSUNAI HIROYUKI

1 patent

ITABASHI NAOSHI

1 patent

HITACHI HIGH TECHNOLOGIES

1 patent