Inventor
ALEXANDER WILLIAM J
US7 patents
⚠️ This page may combine multiple inventors who share the name “ALEXANDER WILLIAM J”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SOLID STATE MEASUREMENTS INC
3 patentsUS6851096B2Feb 1, 2005
Method and apparatus for testing semiconductor wafers
SOLID STATE MEASUREMENTS INC11 citations71
US4090132AMay 16, 1978
Measurement of excess carrier lifetime in semiconductor devices
SOLID STATE MEASUREMENTS INC13 citations71
US6803780B2Oct 12, 2004
Sample chuck with compound construction
SOLID STATE MEASUREMENTS INC2 citations60