Inventor
SCHEINER DAVID
IL31 patents
⚠️ This page may combine multiple inventors who share the name “SCHEINER DAVID”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NOVA MEASURING INSTR LTD
19 patentsUS6974962B2Dec 13, 2005
Lateral shift measurement using an optical technique
NOVA MEASURING INSTR LTD120 citations99
US6100985AAug 8, 2000
Method and apparatus for measurements of patterned structures
NOVA MEASURING INSTR LTD107 citations98
US6476920B1Nov 5, 2002
Method and apparatus for measurements of patterned structures
NOVA MEASURING INSTR LTD153 citations97
US6556947B1Apr 29, 2003
Optical measurements of patterned structures
NOVA MEASURING INSTR LTD79 citations96
US6281974B1Aug 28, 2001
Method and apparatus for measurements of patterned structures
NOVA MEASURING INSTR LTD55 citations96
US6292265B1Sep 18, 2001
Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects
NOVA MEASURING INSTR LTD56 citations95
US9140539B2Sep 22, 2015
Optical system and method for measurement of one or more parameters of via-holes
NOVA MEASURING INSTR LTD19 citations92
US7292341B2Nov 6, 2007
Optical system operating with variable angle of incidence
NOVA MEASURING INSTR LTD33 citations92
US6940609B2Sep 6, 2005
Method and system for measuring the topography of a sample
NOVA MEASURING INSTR LTD25 citations92
US6815947B2Nov 9, 2004
Method and system for thickness measurements of thin conductive layers
NOVA MEASURING INSTR LTD42 citations86
US6801315B2Oct 5, 2004
Method and system for overlay measurement
NOVA MEASURING INSTR LTD13 citations84
US7187456B2Mar 6, 2007
Method and apparatus for measurements of patterned structures
NOVA MEASURING INSTR LTD11 citations83
US6801326B2Oct 5, 2004
Method and apparatus for monitoring a chemical mechanical planarization process applied to metal-based patterned objects
NOVA MEASURING INSTR LTD13 citations83
US7123366B2Oct 17, 2006
Method and apparatus for measurements of patterned structures
NOVA MEASURING INSTR LTD7 citations73
US6836324B2Dec 28, 2004
Method and apparatus for measurements of patterned structures
NOVA MEASURING INSTR LTD8 citations73
US7253970B2Aug 7, 2007
Reflective optical system
NOVA MEASURING INSTR LTD8 citations69
US9785059B2Oct 10, 2017
Lateral shift measurement using an optical technique
NOVA MEASURING INSTR LTD1 citations63
US6885446B2Apr 26, 2005
Method and system for monitoring a process of material removal from the surface of a patterned structure
NOVA MEASURING INSTR LTD6 citations61
US7532414B2May 12, 2009
Reflective optical system
NOVA MEASURING INSTR LTD4 citations58
VIEWNETIC LTD
5 patentsUS11849207B2Dec 19, 2023
Inspection system for use in monitoring plants in plant growth areas
VIEWNETIC LTD1 citations68
US11483471B2Oct 25, 2022
Inspection system for use in monitoring plants in plant growth areas
VIEWNETIC LTD1 citations68
US12445709B2Oct 14, 2025
Inspection system for use in monitoring plants in plant growth areas
VIEWNETIC LTD0 citations57
US11601587B2Mar 7, 2023
System and method for monitoring plants in plant growing areas
VIEWNETIC LTD0 citations57
US12484466B2Dec 2, 2025
Systems and methods for monitoring plants in plant growing areas
VIEWNETIC LTD0 citations47