Inventor
SUNAOSHI TAKESHI
JP6 patents
⚠️ This page may combine multiple inventors who share the name “SUNAOSHI TAKESHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
5 patentsUS7663390B2Feb 16, 2010
Inspection apparatus and method
HITACHI HIGH TECH CORP5 citations72
US10204761B2Feb 12, 2019
Charged particle beam device, electron microscope and sample observation method
HITACHI HIGH TECH CORP2 citations70
US7732791B2Jun 8, 2010
Semiconductor testing method and semiconductor tester
HITACHI HIGH TECH CORP5 citations62
US8040146B2Oct 18, 2011
Inspection apparatus having a heating mechanism for performing sample temperature regulation
HITACHI HIGH TECH CORP2 citations61
US10784074B2Sep 22, 2020
Charged particle beam apparatus and control method thereof
HITACHI HIGH TECH CORP0 citations30