Inventor · disambiguated record
Seok-Won Hwang
Also filed as: HWANG SEOK-WON
5 granted patents·1 pending application·37 citations·filing 2003–2016
77Inventor score
Top patents by PatentIndex Score
6 records- 0180US7707469B2Memory test system including semiconductor memory device suitable for testing an on-die termination, and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 27, 2010·13 cites·23 claims
- 0277US7612578B2Semiconductor device, test system and method of testing on die termination circuitSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 3, 2009·10 cites·18 claims
- 0355US7230857B2Methods of modifying operational characteristic of memory devices using control bits received through data pins and related devices and systemsSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 12, 2007·10 cites·73 claims
- 0444US6822914B2Circuits and methods for generating high frequency extended test pattern data from low frequency test pattern data input to an integrated circuit memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Nov 23, 2004·4 cites·22 claims
- 0541US10153137B2Support unit, substrate treating apparatus including the same, and method for treating a substrateSEMES CO LTD·Filed 2016·Granted Dec 11, 2018·0 cites·29 claims
- 0631US2007101225A1Circuit and method of testing semiconductor memory devicesSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
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