Inventor
THALMANN ERWIN
DE18 patents
⚠️ This page may combine multiple inventors who share the name “THALMANN ERWIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
17 patentsUS6897646B2May 24, 2005
Method for testing wafers to be tested and calibration apparatus
INFINEON TECHNOLOGIES AG11 citations69
US6882139B2Apr 19, 2005
Electronic component, tester device and method for calibrating a tester device
INFINEON TECHNOLOGIES AG11 citations69
US7321497B2Jan 22, 2008
Electronic circuit apparatus and method for stacking electronic circuit units
INFINEON TECHNOLOGIES AG3 citations61
US7254758B2Aug 7, 2007
Method and apparatus for testing circuit units to be tested with different test mode data sets
INFINEON TECHNOLOGIES AG2 citations61
US7228477B2Jun 5, 2007
Apparatus and method for testing circuit units to be tested
INFINEON TECHNOLOGIES AG5 citations61
US7184335B2Feb 27, 2007
Electronic memory apparatus, and method for deactivating redundant bit lines or word lines
INFINEON TECHNOLOGIES AG6 citations61
US7039544B2May 2, 2006
Method for testing circuit units to be tested and test apparatus
INFINEON TECHNOLOGIES AG6 citations61
US7276896B2Oct 2, 2007
Test apparatus and method for testing circuit units to be tested
INFINEON TECHNOLOGIES AG4 citations60
US7353425B2Apr 1, 2008
Data processing circuit apparatus having a data transmission unit of redundant design
INFINEON TECHNOLOGIES AG1 citations51
US7343532B2Mar 11, 2008
Testing memory units in a digital circuit
INFINEON TECHNOLOGIES AG0 citations51
US7340313B2Mar 4, 2008
Monitoring device for monitoring internal signals during initialization of an electronic circuit
INFINEON TECHNOLOGIES AG1 citations51
US7308622B2Dec 11, 2007
Integrated memory and method for testing the memory
INFINEON TECHNOLOGIES AG0 citations50
US10018667B2Jul 10, 2018
Method for testing semiconductor dies
INFINEON TECHNOLOGIES AG0 citations46
US9435849B2Sep 6, 2016
Method for testing semiconductor dies and a test apparatus
INFINEON TECHNOLOGIES AG0 citations46
US7191085B2Mar 13, 2007
Method for testing an electric circuit
INFINEON TECHNOLOGIES AG0 citations40
US7188291B2Mar 6, 2007
Circuit and method for testing a circuit having memory array and addressing and control unit
INFINEON TECHNOLOGIES AG0 citations40
US7143325B2Nov 28, 2006
Method for testing circuit units to be tested by means of majority decisions and test device for performing the method
INFINEON TECHNOLOGIES AG0 citations40