P

Inventor

YI JI-HYE

KR34 patents
⚠️ This page may combine multiple inventors who share the name “YI JI-HYE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

30 patents
US6894305B2May 17, 2005

Phase-change memory devices with a self-heater structure

SAMSUNG ELECTRONICS CO LTD388 citations99
US7402851B2Jul 22, 2008

Phase changeable memory devices including nitrogen and/or silicon and methods for fabricating the same

SAMSUNG ELECTRONICS CO LTD49 citations96
US7126847B2Oct 24, 2006

Method and driver for programming phase change memory cell

SAMSUNG ELECTRONICS CO LTD51 citations96
US7037749B2May 2, 2006

Methods for forming phase changeable memory devices

SAMSUNG ELECTRONICS CO LTD40 citations96
US7642622B2Jan 5, 2010

Phase changeable memory cells and methods of forming the same

SAMSUNG ELECTRONICS CO LTD24 citations92
US7482616B2Jan 27, 2009

Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same

SAMSUNG ELECTRONICS CO LTD39 citations92
US7476917B2Jan 13, 2009

Phase-changeable memory devices including nitrogen and/or silicon dopants

SAMSUNG ELECTRONICS CO LTD31 citations92
US7462900B2Dec 9, 2008

Phase changeable memory devices including nitrogen and/or silicon

SAMSUNG ELECTRONICS CO LTD34 citations92
US7082051B2Jul 25, 2006

Method and driver for programming phase change memory cell

SAMSUNG ELECTRONICS CO LTD22 citations92
US6635921B2Oct 21, 2003

Semiconductor memory device having a multiple tunnel junction layer pattern and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD24 citations92
US10121791B2Nov 6, 2018

Multi-gate transistor

SAMSUNG ELECTRONICS CO LTD7 citations84
US8026543B2Sep 27, 2011

Semiconductor devices having phase change memory cells, electronic systems employing the same and methods of fabricating the same

SAMSUNG ELECTRONICS CO LTD12 citations84
US7763878B2Jul 27, 2010

Phase changeable memory device structures

SAMSUNG ELECTRONICS CO LTD11 citations84
US7394087B2Jul 1, 2008

Phase-changeable memory devices and methods of forming the same

SAMSUNG ELECTRONICS CO LTD13 citations84
US6707089B2Mar 16, 2004

Semiconductor memory device having a multiple tunnel junction pattern and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD14 citations84
US9312376B2Apr 12, 2016

Semiconductor device, method for fabricating the same, and memory system including the semiconductor device

SAMSUNG ELECTRONICS CO LTD6 citations83
US7692176B2Apr 6, 2010

Phase-changeable memory devices including an adiabatic layer

SAMSUNG ELECTRONICS CO LTD6 citations74
US7397092B2Jul 8, 2008

Phase changable memory device structures

SAMSUNG ELECTRONICS CO LTD5 citations74
US7126846B2Oct 24, 2006

Method and driver for programming phase change memory cell

SAMSUNG ELECTRONICS CO LTD9 citations74
US6998306B2Feb 14, 2006

Semiconductor memory device having a multiple tunnel junction pattern and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD7 citations74
US7889548B2Feb 15, 2011

Method for reducing a reset current for resetting a portion of a phase change material in a memory cell of a phase change memory device and the phase change memory device

SAMSUNG ELECTRONICS CO LTD6 citations73
US9786785B2Oct 10, 2017

Semiconductor device, method for fabricating the same, and memory system including the semiconductor device

SAMSUNG ELECTRONICS CO LTD4 citations72
US7989259B2Aug 2, 2011

Methods of manufacturing phase-changeable memory devices including upper and lower electrodes

SAMSUNG ELECTRONICS CO LTD2 citations63
US7879668B2Feb 1, 2011

Method of manufacturing a semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations63
US7791146B2Sep 7, 2010

Semiconductor device including field effect transistor and method of forming the same

SAMSUNG ELECTRONICS CO LTD2 citations63
US7741631B2Jun 22, 2010

Phase-changeable memory devices including phase-changeable materials on silicon nitride layers

SAMSUNG ELECTRONICS CO LTD2 citations63
US6686240B2Feb 3, 2004

Semiconductor memory device having a multiple tunnel junction layer pattern and method of fabricating the same

SAMSUNG ELECTRONICS CO LTD5 citations63
US7981750B2Jul 19, 2011

Methods of fabrication of channel-stressed semiconductor devices

SAMSUNG ELECTRONICS CO LTD6 citations62
US7606064B2Oct 20, 2009

Method for reducing a reset current for resetting a portion of a phase change material in a memory cell of a phase change memory device and the phase change memory device

SAMSUNG ELECTRONICS CO LTD3 citations62
US7569430B2Aug 4, 2009

Phase changeable structure and method of forming the same

SAMSUNG ELECTRONICS CO LTD0 citations52

KIM MYUNG-SUN

3 patents

HA YONG-HO

1 patent