Inventor
BENWARE ROBERT
US3 patents
Patents
3 patentsUS6972592B2Dec 6, 2005
Self-timed scan circuit for ASIC fault testing
LSI LOGIC CORP19 citations86
US6954705B2Oct 11, 2005
Method of screening defects using low voltage IDDQ measurement
LSI LOGIC CORP5 citations56
US7079963B2Jul 18, 2006
Modified binary search for optimizing efficiency of data collection time
LSI LOGIC CORP3 citations54