P

Inventor

YAMAGUCHI TAKAHIRO

JP359 patents
⚠️ This page may combine multiple inventors who share the name “YAMAGUCHI TAKAHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ADVANTEST CORP

30 patents
US6795496B1Sep 21, 2004

Jitter measuring device and method

ADVANTEST CORP117 citations98
US6975978B1Dec 13, 2005

Method and apparatus for fault simulation of semiconductor integrated circuit

ADVANTEST CORP64 citations96
US6621860B1Sep 16, 2003

Apparatus for and method of measuring a jitter

ADVANTEST CORP44 citations96
US6661839B1Dec 9, 2003

Method and device for compressing and expanding data pattern

ADVANTEST CORP139 citations95
US7525593B2Apr 28, 2009

Position detection apparatus, position detection method, testing apparatus, and camera module manufacturing apparatus

ADVANTEST CORP20 citations93
US7305025B2Dec 4, 2007

Measurement instrument and measurement method

ADVANTEST CORP22 citations93
US7254764B2Aug 7, 2007

Generating test patterns used in testing semiconductor integrated circuit

ADVANTEST CORP14 citations93
US7225377B2May 29, 2007

Generating test patterns used in testing semiconductor integrated circuit

ADVANTEST CORP13 citations93
US7203229B1Apr 10, 2007

Apparatus for and method of measuring jitter

ADVANTEST CORP23 citations93
US7127018B2Oct 24, 2006

Apparatus for and method of measuring clock skew

ADVANTEST CORP17 citations93
US6922439B2Jul 26, 2005

Apparatus for and method of measuring jitter

ADVANTEST CORP42 citations93
US6828815B2Dec 7, 2004

Method and apparatus for defect analysis of semiconductor integrated circuit

ADVANTEST CORP17 citations93
US6775321B1Aug 10, 2004

Apparatus for and method of measuring a jitter

ADVANTEST CORP25 citations93
US6687629B1Feb 3, 2004

Apparatus for and method of measuring a jitter

ADVANTEST CORP38 citations93
US6598004B1Jul 22, 2003

Jitter measurement apparatus and its method

ADVANTEST CORP51 citations93
US6593765B1Jul 15, 2003

Testing apparatus and testing method for semiconductor integrated circuit

ADVANTEST CORP26 citations93
US6594595B2Jul 15, 2003

Apparatus for and method of measuring cross-correlation coefficient between signals

ADVANTEST CORP19 citations93
US6525523B1Feb 25, 2003

Jitter measurement apparatus and its method

ADVANTEST CORP26 citations93
US6460001B1Oct 1, 2002

Apparatus for and method of measuring a peak jitter

ADVANTEST CORP32 citations93
US6423558B1Jul 23, 2002

Method for fabricating integrated circuit (IC) dies with multi-layered interconnect structures

ADVANTEST CORP46 citations93
US6400129B1Jun 4, 2002

Apparatus for and method of detecting a delay fault in a phase-locked loop circuit

ADVANTEST CORP28 citations93
US6326909B1Dec 4, 2001

Evaluation system for analog-digital or digital-analog converter

ADVANTEST CORP36 citations93
US6177894B1Jan 23, 2001

Evaluation system and method for AD converter

ADVANTEST CORP24 citations93
US7636387B2Dec 22, 2009

Measuring apparatus and measuring method

ADVANTEST CORP22 citations92
US7253443B2Aug 7, 2007

Electronic device with integrally formed light emitting device and supporting member

ADVANTEST CORP30 citations92
US7054358B2May 30, 2006

Measuring apparatus and measuring method

ADVANTEST CORP24 citations92
US6418391B1Jul 9, 2002

Testing system for performing an operation of an application which controls testing equipment for testing a device under test and method for controlling the same

ADVANTEST CORP49 citations92
US4774454ASep 27, 1988

Distortion measuring system method utilizing signal suppression

ADVANTEST CORP35 citations91
US6229316B1May 8, 2001

Measuring method by spectrum analyzer

ADVANTEST CORP31 citations90
US4761634AAug 2, 1988

AD converting device

ADVANTEST CORP30 citations88

MITSUBISHI ELECTRIC CORP

8 patents
USD767748SSep 27, 2016

Air conditioner

MITSUBISHI ELECTRIC CORP58 citations98
USD742335SNov 3, 2015

Remote controller

MITSUBISHI ELECTRIC CORP52 citations98
USD767749SSep 27, 2016

Air conditioner

MITSUBISHI ELECTRIC CORP31 citations94
USD767750SSep 27, 2016

Air conditioner

MITSUBISHI ELECTRIC CORP33 citations94
USD564797SMar 25, 2008

Stand for television set

MITSUBISHI ELECTRIC CORP26 citations93
USD563695SMar 11, 2008

Stand for television set

MITSUBISHI ELECTRIC CORP26 citations93
USD770024SOct 25, 2016

Air conditioner

MITSUBISHI ELECTRIC CORP19 citations92
USD767751SSep 27, 2016

Air conditioner

MITSUBISHI ELECTRIC CORP22 citations92

DENSO CORP

2 patents
US6142581ANov 7, 2000

Hydraulic circuit having a rotary type pump and brake apparatus for a vehicle provided with the same

DENSO CORP73 citations95
US6474751B1Nov 5, 2002

Hydraulic circuit having a rotary type pump and brake apparatus for a vehicle provided with the same

DENSO CORP42 citations92

HITACHI LTD

2 patents
US6100939AAug 8, 2000

Tone display method and apparatus for displaying image signal

HITACHI LTD63 citations95
US6333766B1Dec 25, 2001

Tone display method and apparatus for displaying image signal

HITACHI LTD18 citations92

FUJITSU LTD

2 patents
US6529204B1Mar 4, 2003

Method of and apparatus for displaying halftone images

FUJITSU LTD40 citations92
US5907316AMay 25, 1999

Method of and apparatus for displaying halftone images

FUJITSU LTD39 citations92

DAIICHI SANKYO CO LTD

1 patent
US7923573B2Apr 12, 2011

Benzene compound having 2 or more substituents

DAIICHI SANKYO CO LTD90 citations94

OKUMA MACHINERY WORKS LTD

1 patent
US5198984AMar 30, 1993

Numerical control method for correcting machine tool path errors

OKUMA MACHINERY WORKS LTD28 citations93

NIPPON SOKEN

1 patent
US6905321B2Jun 14, 2005

Rotary pump for braking apparatus

NIPPON SOKEN29 citations92

SHIN KOBE ELECTRIC MACHINERY

1 patent
US4913955AApr 3, 1990

Epoxy resin laminate

SHIN KOBE ELECTRIC MACHINERY28 citations91

DAIKIN IND LTD

1 patent
US7392158B2Jun 24, 2008

Drive unit for compressor and refrigerator

DAIKIN IND LTD31 citations89

MORINAGA & CO

1 patent
USD718127SNov 25, 2014

Packaging container cap

MORINAGA & CO27 citations87

Showing the top 50 of 359 patents by PatentIndex Score.