Inventor
VALCORE JR JOHN C
US84 patents
⚠️ This page may combine multiple inventors who share the name “VALCORE JR JOHN C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LAM RES CORP
41 patentsUS9842725B2Dec 12, 2017
Using modeling to determine ion energy associated with a plasma system
LAM RES CORP48 citations98
US9390893B2Jul 12, 2016
Sub-pulsing during a state
LAM RES CORP35 citations98
US9508529B2Nov 29, 2016
System, method and apparatus for RF power compensation in a plasma processing system
LAM RES CORP123 citations97
US10469108B2Nov 5, 2019
Systems and methods for using computer-generated models to reduce reflected power towards a high frequency RF generator during a cycle of operations of a low frequency RF generator
LAM RES CORP35 citations94
US10231321B2Mar 12, 2019
State-based adjustment of power and frequency
LAM RES CORP17 citations94
US10157729B2Dec 18, 2018
Soft pulsing
LAM RES CORP25 citations94
US9779196B2Oct 3, 2017
Segmenting a model within a plasma system
LAM RES CORP35 citations94
US9720022B2Aug 1, 2017
Systems and methods for providing characteristics of an impedance matching model for use with matching networks
LAM RES CORP21 citations94
US9620337B2Apr 11, 2017
Determining a malfunctioning device in a plasma system
LAM RES CORP29 citations94
US10102321B2Oct 16, 2018
System, method and apparatus for refining radio frequency transmission system models
LAM RES CORP52 citations93
US9620334B2Apr 11, 2017
Control of etch rate using modeling, feedback and impedance match
LAM RES CORP20 citations93
US9607810B2Mar 28, 2017
Impedance-based adjustment of power and frequency
LAM RES CORP19 citations93
US9462672B2Oct 4, 2016
Adjustment of power and frequency based on three or more states
LAM RES CORP13 citations93
US9711332B2Jul 18, 2017
Systems and methods for tuning an impedance matching network in a step-wise fashion for multiple states of an RF generator
LAM RES CORP17 citations92
US9831065B2Nov 28, 2017
Computation of statistics for statistical data decimation
LAM RES CORP15 citations91
US9295148B2Mar 22, 2016
Computation of statistics for statistical data decimation
LAM RES CORP17 citations91
US10950421B2Mar 16, 2021
Using modeling for identifying a location of a fault in an RF transmission system for a plasma system
LAM RES CORP11 citations86
US11361942B2Jun 14, 2022
Adjustment of power and frequency based on three or more states
LAM RES CORP4 citations84
US10853444B2Dec 1, 2020
Systems and methods for tuning an impedance matching network in a step-wise fashion
LAM RES CORP5 citations84
US10762266B2Sep 1, 2020
Segmenting a model within a plasma system
LAM RES CORP4 citations84
US10621265B2Apr 14, 2020
Systems and methods for tuning an impedance matching network in a step-wise fashion
LAM RES CORP6 citations84
US10296676B2May 21, 2019
Systems and methods for tuning an impedance matching network in a step-wise fashion
LAM RES CORP10 citations84
US10256077B2Apr 9, 2019
Sub-pulsing during a state
LAM RES CORP4 citations84
US10074520B2Sep 11, 2018
Adjustment of power and frequency based on three or more states
LAM RES CORP7 citations84
US10032605B2Jul 24, 2018
Methods and apparatus for controlling plasma in a plasma processing system
LAM RES CORP6 citations84
US10020168B1Jul 10, 2018
Systems and methods for increasing efficiency of delivered power of a megahertz radio frequency generator in the presence of a kilohertz radio frequency generator
LAM RES CORP6 citations84
US9997333B2Jun 12, 2018
Sub-pulsing during a state
LAM RES CORP11 citations84
US9960015B2May 1, 2018
Impedance-based adjustment of power and frequency
LAM RES CORP9 citations84
US9837252B2Dec 5, 2017
Systems and methods for using one or more fixtures and efficiency to determine parameters of a match network model
LAM RES CORP10 citations84
US9831071B2Nov 28, 2017
Systems and methods for using multiple inductive and capacitive fixtures for applying a variety of plasma conditions to determine a match network model
LAM RES CORP12 citations84
US9812294B2Nov 7, 2017
Sub-pulsing during a state
LAM RES CORP11 citations84
US9667303B2May 30, 2017
Dual push between a host computer system and an RF generator
LAM RES CORP5 citations84
US9652567B2May 16, 2017
System, method and apparatus for improving accuracy of RF transmission models for selected portions of an RF transmission path
LAM RES CORP9 citations84
US9530620B2Dec 27, 2016
Dual control modes
LAM RES CORP10 citations84
US9236228B2Jan 12, 2016
Frequency enhanced impedance dependent power control for multi-frequency RF pulsing
LAM RES CORP7 citations84
US9030101B2May 12, 2015
Frequency enhanced impedance dependent power control for multi-frequency RF pulsing
LAM RES CORP13 citations84
US9673026B2Jun 6, 2017
Edge ramping
LAM RES CORP9 citations83
US9627186B2Apr 18, 2017
System, method and apparatus for using optical data to monitor RF generator operations
LAM RES CORP14 citations83
US9455126B2Sep 27, 2016
Arrangement for plasma processing system control based on RF voltage
LAM RES CORP12 citations83
US10325759B2Jun 18, 2019
Multiple control modes
LAM RES CORP11 citations81
US10748748B2Aug 18, 2020
RF impedance model based fault detection
LAM RES CORP7 citations79
VALCORE JR JOHN C
9 patentsUS9320126B2Apr 19, 2016
Determining a value of a variable on an RF transmission model
VALCORE JR JOHN C47 citations98
US9114666B2Aug 25, 2015
Methods and apparatus for controlling plasma in a plasma processing system
VALCORE JR JOHN C37 citations98
US9368329B2Jun 14, 2016
Methods and apparatus for synchronizing RF pulses in a plasma processing system
VALCORE JR JOHN C24 citations94
US9408288B2Aug 2, 2016
Edge ramping
VALCORE JR JOHN C27 citations93
US9197196B2Nov 24, 2015
State-based adjustment of power and frequency
VALCORE JR JOHN C17 citations93
US9171699B2Oct 27, 2015
Impedance-based adjustment of power and frequency
VALCORE JR JOHN C24 citations93
US8901935B2Dec 2, 2014
Methods and apparatus for detecting the confinement state of plasma in a plasma processing system
VALCORE JR JOHN C31 citations93
US8501631B2Aug 6, 2013
Plasma processing system control based on RF voltage
VALCORE JR JOHN C31 citations92
US9502216B2Nov 22, 2016
Using modeling to determine wafer bias associated with a plasma system
VALCORE JR JOHN C11 citations84
Showing the top 50 of 84 patents by PatentIndex Score.