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Inventor
BAUGH JIM R
US
2 patents
Patents
2 patents
US7749663B2
Jul 6, 2010
Method for adjusting dimensions of photomask features
MICRON TECHNOLOGY INC
0 citations
44
US7186480B2
Mar 6, 2007
Method for adjusting dimensions of photomask features
MICRON TECHNOLOGY INC
0 citations
44