Inventor

FUKUI MUNETOSHI

JP3 patents

⚠️ This page may combine multiple inventors who share the name “FUKUI MUNETOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI HIGH TECH CORP

1 patent

US7663104B2Feb 16, 2010

Specimen inspection equipment and how to make electron beam absorbed current images

HITACHI HIGH TECH CORP6 citations71

OBUKI TOMOHARU

1 patent

US8178840B2May 15, 2012

Specimen inspection equipment and how to make the electron beam absorbed current images

OBUKI TOMOHARU2 citations54

UNIV TOKYO

1 patent

US12477763B2Nov 18, 2025

Semiconductor device

UNIV TOKYO0 citations48