Inventor
LIN LIH-WEI
TW21 patents
⚠️ This page may combine multiple inventors who share the name “LIN LIH-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
WINBOND ELECTRONICS CORP
20 patentsUS10439829B1Oct 8, 2019
Physical unclonable function code generating method and providing apparatus thereof
WINBOND ELECTRONICS CORP9 citations83
US9691980B1Jun 27, 2017
Method for forming memory device
WINBOND ELECTRONICS CORP11 citations82
US9627059B2Apr 18, 2017
Resistive memory and data writing method for memory cell thereof
WINBOND ELECTRONICS CORP2 citations71
US10347336B1Jul 9, 2019
Method for obtaining optimal operating condition of resistive random access memory
WINBOND ELECTRONICS CORP2 citations70
US10468100B1Nov 5, 2019
Detecting method for a resistive random access memory cell
WINBOND ELECTRONICS CORP2 citations65
US10490272B2Nov 26, 2019
Operating method of resistive memory element
WINBOND ELECTRONICS CORP1 citations62
US11175988B2Nov 16, 2021
Memory storage device and data access method
WINBOND ELECTRONICS CORP1 citations61
US11437101B2Sep 6, 2022
Resistive memory storage apparatus and operating method thereof
WINBOND ELECTRONICS CORP0 citations58
US10978149B1Apr 13, 2021
Resistive memory apparatus and adjusting method for write-in voltage thereof
WINBOND ELECTRONICS CORP0 citations58
US12474405B2Nov 18, 2025
Test device and testing method for memory device
WINBOND ELECTRONICS CORP0 citations53
US11776636B2Oct 3, 2023
Memory array and operation method thereof
WINBOND ELECTRONICS CORP0 citations51
US10643698B2May 5, 2020
Operating method of resistive memory storage apparatus
WINBOND ELECTRONICS CORP0 citations50
US9620208B2Apr 11, 2017
Devices and methods for programming a resistive random-access memory
WINBOND ELECTRONICS CORP1 citations50
US11289160B2Mar 29, 2022
Memory device and data writing method
WINBOND ELECTRONICS CORP0 citations48
US10726890B2Jul 28, 2020
Resistive memory apparatus and operating method thereof
WINBOND ELECTRONICS CORP0 citations43
US10818353B1Oct 27, 2020
Method for ripening resistive random access memory
WINBOND ELECTRONICS CORP0 citations42
US9543010B2Jan 10, 2017
Resistive memory and measurement system thereof
WINBOND ELECTRONICS CORP0 citations40
US10636507B2Apr 28, 2020
Memory-testing methods for testing memory having error-correcting code
WINBOND ELECTRONICS CORP0 citations39
US10490275B2Nov 26, 2019
Resistive memory storage apparatus and writing method thereof including disturbance voltage
WINBOND ELECTRONICS CORP0 citations39
US10783962B2Sep 22, 2020
Resistive memory storage apparatus and writing method thereof including disturbance voltage
WINBOND ELECTRONICS CORP0 citations30