Inventor
NOH KWANG SOOK
KR14 patents
⚠️ This page may combine multiple inventors who share the name “NOH KWANG SOOK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
10 patentsUS7230475B2Jun 12, 2007
Semiconductor devices including an external power voltage control function and methods of operating the same
SAMSUNG ELECTRONICS CO LTD25 citations90
US9147461B1Sep 29, 2015
Semiconductor memory device performing a refresh operation, and memory system including the same
SAMSUNG ELECTRONICS CO LTD14 citations84
US6590429B2Jul 8, 2003
Data receivers for reproducing data input signals and methods for detecting data signals in data input receivers
SAMSUNG ELECTRONICS CO LTD16 citations84
US7843752B2Nov 30, 2010
Circuit and method for controlling refresh periods in semiconductor memory devices
SAMSUNG ELECTRONICS CO LTD7 citations73
US7716550B2May 11, 2010
Semiconductor IC including pad for wafer test and method of testing wafer including semiconductor IC
SAMSUNG ELECTRONICS CO LTD3 citations62
US7541845B2Jun 2, 2009
Signal receiver apparatus and method for detecting logic state represented by an input signal and semiconductor integrated circuit device having the same
SAMSUNG ELECTRONICS CO LTD5 citations62
US6876564B2Apr 5, 2005
Integrated circuit device and method for applying different types of signals to internal circuit via one pin
SAMSUNG ELECTRONICS CO LTD6 citations61
US12517665B2Jan 6, 2026
Volatile memory device
SAMSUNG ELECTRONICS CO LTD0 citations60
US12176021B2Dec 24, 2024
Volatile memory device
SAMSUNG ELECTRONICS CO LTD0 citations60
US12014769B2Jun 18, 2024
Volatile memory device
SAMSUNG ELECTRONICS CO LTD0 citations60
NOH KWANG-SOOK
3 patentsUS8218137B2Jul 10, 2012
Methods of operating DRAM devices having adjustable internal refresh cycles that vary in response to on-chip temperature changes
NOH KWANG-SOOK27 citations92
US8331161B2Dec 11, 2012
Semiconductor memory device having swap function for data output pads
NOH KWANG-SOOK10 citations82
US8537633B2Sep 17, 2013
Methods of operating DRAM devices having adjustable internal refresh cycles that vary in response to on-chip temperature changes
NOH KWANG-SOOK3 citations62