P

Inventor

HUANG JIAN-SHIOU

TW16 patents

Patents

16 patents
US9825117B2Nov 21, 2017

MIM/RRAM structure with improved capacitance and reduced leakage current

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US9761799B2Sep 12, 2017

Bottom electrode structure for improved electric field uniformity

TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US9502649B2Nov 22, 2016

Bottom electrode structure for improved electric field uniformity

TAIWAN SEMICONDUCTOR MFG CO LTD10 citations84
US9257642B1Feb 9, 2016

Protective sidewall techniques for RRAM

TAIWAN SEMICONDUCTOR MFG CO LTD18 citations84
US9887134B2Feb 6, 2018

Semiconductor devices, methods of manufacture thereof, and methods of singulating semiconductor devices

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9543375B2Jan 10, 2017

MIM/RRAM structure with improved capacitance and reduced leakage current

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US9450183B2Sep 20, 2016

Memory structure having top electrode with protrusion

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US10361113B2Jul 23, 2019

Formation and in-situ treatment processes for gap fill layers

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US10468409B2Nov 5, 2019

FinFET device with oxidation-resist STI liner structure

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US9425061B2Aug 23, 2016

Buffer cap layer to improve MIM structure performance

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations63
US12336201B2Jun 17, 2025

Capacitor structure and method of making the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11038010B2Jun 15, 2021

Capacitor structure and method of making the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10978305B2Apr 13, 2021

Manufacturing method for a film stack of a semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10937686B2Mar 2, 2021

Formation and in-situ treatment processes for gap fill layers

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10176999B2Jan 8, 2019

Semiconductor device having a multi-layer, metal-containing film

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10629497B2Apr 21, 2020

FinFET device structure and method for enlarging gap-fill window

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations40