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Inventor
KAPASI SANJAY
US
2 patents
Patents
2 patents
US10216096B2
Feb 26, 2019
Process-sensitive metrology systems and methods
KLA TENCOR CORP
2 citations
71
US10030965B2
Jul 24, 2018
Model-based hot spot monitoring
KLA TENCOR CORP
2 citations
70