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Inventor
WAGNER TOLGA
DE
2 patents
Patents
2 patents
US12038720B2
Jul 16, 2024
Arrangement and method for detecting a measured value on the basis of electron holography
UNIV BERLIN TECH
0 citations
40
US11293747B2
Apr 5, 2022
Method and apparatus for carrying out a time-resolved interferometric measurement
UNIV BERLIN TECH
0 citations
40