Inventor

YI HYUN-BEAN

KR3 patents

⚠️ This page may combine multiple inventors who share the name “YI HYUN-BEAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KOREA ELECTRONICS TECHNOLOGY

2 patents

US7673203B2Mar 2, 2010

Interconnect delay fault test controller and test apparatus using the same

KOREA ELECTRONICS TECHNOLOGY9 citations81

US7895499B2Feb 22, 2011

Method and apparatus for checking pipelined parallel cyclic redundancy

KOREA ELECTRONICS TECHNOLOGY0 citations50

UNIV SOGANG IND UNIV COOP FOUN

1 patent

US7624320B2Nov 24, 2009

Apparatus for testing system-on-chip

UNIV SOGANG IND UNIV COOP FOUN5 citations59