Inventor
KO JUNYOUNG
KR23 patents
⚠️ This page may combine multiple inventors who share the name “KO JUNYOUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
18 patentsUS9768141B2Sep 19, 2017
Removal apparatuses for semiconductor chips
SAMSUNG ELECTRONICS CO LTD2 citations70
US11798626B2Oct 24, 2023
Nonvolatile memory device and method of operating a nonvolatile memory
SAMSUNG ELECTRONICS CO LTD0 citations60
US11475956B2Oct 18, 2022
Nonvolatile memory device and method of operating a nonvolatile memory
SAMSUNG ELECTRONICS CO LTD1 citations60
US12488827B2Dec 2, 2025
CXL device and operation method of CXL device
SAMSUNG ELECTRONICS CO LTD0 citations59
US12462887B2Nov 4, 2025
Memory device included in memory system and method for detecting fail memory cell thereof
SAMSUNG ELECTRONICS CO LTD0 citations59
US12347510B2Jul 1, 2025
Bonding defect detection for die-to-die bonding in memory devices
SAMSUNG ELECTRONICS CO LTD0 citations59
US12230312B2Feb 18, 2025
Memory device and defense method thereof
SAMSUNG ELECTRONICS CO LTD0 citations59
US12204772B2Jan 21, 2025
Memory devices and methods for managing use history
SAMSUNG ELECTRONICS CO LTD0 citations59
US10629564B2Apr 21, 2020
Removal apparatuses for semiconductor chips
SAMSUNG ELECTRONICS CO LTD0 citations49
US12578362B2Mar 17, 2026
Test devices and systems that utilize efficient test algorithms to evaluate devices under test
SAMSUNG ELECTRONICS CO LTD0 citations48
US12530138B2Jan 20, 2026
Memory control device and refresh control method thereof
SAMSUNG ELECTRONICS CO LTD0 citations48
US12431212B2Sep 30, 2025
Row decoder circuit, memory device and memory system
SAMSUNG ELECTRONICS CO LTD0 citations48
US12308083B2May 20, 2025
Volatile memory devices and methods of operating same to improve reliability
SAMSUNG ELECTRONICS CO LTD0 citations48
US12131798B2Oct 29, 2024
Non-volatile memory device for detecting defects of bit lines and word lines
SAMSUNG ELECTRONICS CO LTD0 citations47
US8866295B2Oct 21, 2014
Semiconductor memory modules and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations46
US8749044B2Jun 10, 2014
Semiconductor memory modules and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD1 citations46
US11474149B2Oct 18, 2022
Test apparatuses for testing semiconductor packages and manufacturing systems for manufacturing semiconductor packages having the same and methods of manufacturing the semiconductor packages using the same
SAMSUNG ELECTRONICS CO LTD0 citations44
US11373942B2Jun 28, 2022
Semiconductor devices
SAMSUNG ELECTRONICS CO LTD0 citations43