Inventor
LI LAIN-JONG
TW73 patents
⚠️ This page may combine multiple inventors who share the name “LI LAIN-JONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
24 patentsUS11430666B2Aug 30, 2022
Semiconductor device and method of manufacturing semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations82
US11910732B2Feb 20, 2024
Resistive memory devices using a carbon-based conductor line and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11349069B2May 31, 2022
Resistive memory devices using a carbon-based conductor line and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11244866B2Feb 8, 2022
Low dimensional material device and method
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11824106B2Nov 21, 2023
Semiconductor device and method of fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11239354B2Feb 1, 2022
Semiconductor device and method of fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11923203B2Mar 5, 2024
Semiconductor device and method of manufacturing semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations71
US11094811B2Aug 17, 2021
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations71
US11037783B2Jun 15, 2021
Field effect transistor using transition metal dichalcogenide and a method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations71
US11527659B2Dec 13, 2022
Semiconductor device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations69
US12364170B2Jul 15, 2025
Resistive memory devices using a carbon-based conductor line and methods for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations63
US12400860B2Aug 26, 2025
Semiconductor device with two-dimensional materials
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12211931B2Jan 28, 2025
Fin field-effect transistor device with low-dimensional material and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12170323B2Dec 17, 2024
Nano transistors with source/drain having side contacts to 2-D material
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12166113B2Dec 10, 2024
Semiconductor device and method of fabricating the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11955527B2Apr 9, 2024
Nano transistors with source/drain having side contacts to 2-D material
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11854895B2Dec 26, 2023
Transistors with channels formed of low-dimensional materials and method forming same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11688605B2Jun 27, 2023
Semiconductor device with two-dimensional materials
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations62
US11476356B2Oct 18, 2022
Fin field-effect transistor device with low-dimensional material and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11158807B2Oct 26, 2021
Field effect transistor and method of manufacturing the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12490478B2Dec 2, 2025
Semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12387944B2Aug 12, 2025
Semiconductor device and method of manufacturing semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12211930B2Jan 28, 2025
Semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11581185B2Feb 14, 2023
Field effect transistor using transition metal dichalcogenide and a method for forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
TAIWAN SEMICONDUCTOR MFG
17 patentsUS6602779B1Aug 5, 2003
Method for forming low dielectric constant damascene structure while employing carbon doped silicon oxide planarizing stop layer
TAIWAN SEMICONDUCTOR MFG225 citations99
US6372661B1Apr 16, 2002
Method to improve the crack resistance of CVD low-k dielectric constant material
TAIWAN SEMICONDUCTOR MFG60 citations96
US6358839B1Mar 19, 2002
Solution to black diamond film delamination problem
TAIWAN SEMICONDUCTOR MFG53 citations96
US6657284B1Dec 2, 2003
Graded dielectric layer and method for fabrication thereof
TAIWAN SEMICONDUCTOR MFG24 citations93
US6407013B1Jun 18, 2002
Soft plasma oxidizing plasma method for forming carbon doped silicon containing dielectric layer with enhanced adhesive properties
TAIWAN SEMICONDUCTOR MFG43 citations93
US6483173B2Nov 19, 2002
Solution to black diamond film delamination problem
TAIWAN SEMICONDUCTOR MFG40 citations92
US6756321B2Jun 29, 2004
Method for forming a capping layer over a low-k dielectric with improved adhesion and reduced dielectric constant
TAIWAN SEMICONDUCTOR MFG49 citations91
US6753260B1Jun 22, 2004
Composite etching stop in semiconductor process integration
TAIWAN SEMICONDUCTOR MFG29 citations91
US6812135B2Nov 2, 2004
Adhesion enhancement between CVD dielectric and spin-on low-k silicate films
TAIWAN SEMICONDUCTOR MFG15 citations84
US6645864B1Nov 11, 2003
Physical vapor deposition of an amorphous silicon liner to eliminate resist poisoning
TAIWAN SEMICONDUCTOR MFG18 citations84
US6908773B2Jun 21, 2005
ATR-FTIR metal surface cleanliness monitoring
TAIWAN SEMICONDUCTOR MFG6 citations74
US6806185B2Oct 19, 2004
Method for forming low dielectric constant damascene structure while employing a carbon doped silicon oxide capping layer
TAIWAN SEMICONDUCTOR MFG7 citations74
US6654109B2Nov 25, 2003
System for detecting surface defects in semiconductor wafers
TAIWAN SEMICONDUCTOR MFG9 citations74
US6623654B2Sep 23, 2003
Thin interface layer to improve copper etch stop
TAIWAN SEMICONDUCTOR MFG5 citations72
US6794295B1Sep 21, 2004
Method to improve stability and reliability of CVD low K dielectric
TAIWAN SEMICONDUCTOR MFG6 citations63
US6878621B2Apr 12, 2005
Method of fabricating barrierless and embedded copper damascene interconnects
TAIWAN SEMICONDUCTOR MFG5 citations62
US7042049B2May 9, 2006
Composite etching stop in semiconductor process integration
TAIWAN SEMICONDUCTOR MFG2 citations61
LI LAIN-JONG
2 patentsUNIV KING ABDULLAH SCI & TECH
2 patentsUS11538682B2Dec 27, 2022
Method for growing a transition metal dichalcogenide layer, transition metal dichalcogenide growth device, and method for forming a semiconductor device
UNIV KING ABDULLAH SCI & TECH5 citations70
US11133522B2Sep 28, 2021
Lithium-sulfur battery, a dual blocking layer, methods of making, and methods of use thereof
UNIV KING ABDULLAH SCI & TECH0 citations62
TAIWAN SEMICONDUCTOR MANFACTUR
1 patentSHI YUMENG
1 patentACADEMIA SINICA
1 patentNAT INST CHUNG SHAN SCIENCE & TECHNOLOGY
1 patentMASSACHUSETTS INST TECHNOLOGY
1 patentShowing the top 50 of 73 patents by PatentIndex Score.