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Inventor
VERMEULEN HUBERTUS GERARDUS HE
NL
2 patents
Patents
2 patents
US6988230B2
Jan 17, 2006
Test arrangement for assemblages of intergrated circuit blocks
KONINKL PHILIPS ELECTRONICS NV
27 citations
86
US7076709B2
Jul 11, 2006
Testing of circuit with plural clock domains
KONINKL PHILIPS ELECTRONICS NV
11 citations
80