Inventor

YARON LIOR

IL4 patents

Patents

4 patents

US11662324B1May 30, 2023

Three-dimensional surface metrology of wafers

APPLIED MATERIALS ISRAEL LTD2 citations66

US11264202B2Mar 1, 2022

Generating three dimensional information regarding structural elements of a specimen

APPLIED MATERIALS ISRAEL LTD1 citations58

US12456600B2Oct 28, 2025

Scanning electron microscopy-based tomography of specimens

APPLIED MATERIALS ISRAEL LTD0 citations45

US11921063B2Mar 5, 2024

Lateral recess measurement in a semiconductor specimen

APPLIED MATERIALS ISRAEL LTD0 citations44