Inventor

VON REYN TIMOTHY J

US3 patents

Patents

3 patents

US6643807B1Nov 4, 2003

Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing test

IBM89 citations96

US7308621B2Dec 11, 2007

Testing of ECC memories

IBM28 citations91

US7149941B2Dec 12, 2006

Optimized ECC/redundancy fault recovery

IBM3 citations61