Inventor

ZHENG WEN-YUE

US2 patents

⚠️ This page may combine multiple inventors who share the name “ZHENG WEN-YUE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

1 patent

US7153774B2Dec 26, 2006

Method of making a semiconductor device that has copper damascene interconnects with enhanced electromigration reliability

INTEL CORP14 citations80

SEMICONDUCTOR MFG INT SHANGHAI

1 patent

US7897508B2Mar 1, 2011

Method to eliminate Cu dislocation for reliability and yield

SEMICONDUCTOR MFG INT SHANGHAI1 citations41