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Inventor
HASH ROBERT C
US
2 patents
Patents
2 patents
US6734683B2
May 11, 2004
Method and apparatus for in-circuit testing of sockets
INTEL CORP
15 citations
76
US7412342B2
Aug 12, 2008
Low cost test for IC's or electrical modules using standard reconfigurable logic devices
INTEL CORP
5 citations
54