Inventor
SUN SHIH-WEI
TW71 patents
⚠️ This page may combine multiple inventors who share the name “SUN SHIH-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
32 patentsUS6203863B1Mar 20, 2001
Method of gap filling
UNITED MICROELECTRONICS CORP318 citations99
US5811283ASep 22, 1998
Silicon on insulator (SOI) dram cell structure and process
UNITED MICROELECTRONICS CORP178 citations99
US5801094ASep 1, 1998
Dual damascene process
UNITED MICROELECTRONICS CORP178 citations99
US6010931AJan 4, 2000
Planarization technique for DRAM cell capacitor electrode
UNITED MICROELECTRONICS CORP88 citations98
US5968610AOct 19, 1999
Multi-step high density plasma chemical vapor deposition process
UNITED MICROELECTRONICS CORP371 citations98
US6492256B2Dec 10, 2002
Method for forming an interconnect structure with air gap compatible with unlanded vias
UNITED MICROELECTRONICS CORP56 citations96
US6492732B2Dec 10, 2002
Interconnect structure with air gap compatible with unlanded vias
UNITED MICROELECTRONICS CORP66 citations96
US6350672B1Feb 26, 2002
Interconnect structure with gas dielectric compatible with unlanded vias
UNITED MICROELECTRONICS CORP61 citations96
US6265780B1Jul 24, 2001
Dual damascene structure for the wiring-line structures of multi-level interconnects in integrated circuit
UNITED MICROELECTRONICS CORP65 citations96
US5960299ASep 28, 1999
Method of fabricating a shallow-trench isolation structure in integrated circuit
UNITED MICROELECTRONICS CORP77 citations96
US5753559AMay 19, 1998
Method for growing hemispherical grain silicon
UNITED MICROELECTRONICS CORP59 citations96
US6117345ASep 12, 2000
High density plasma chemical vapor deposition process
UNITED MICROELECTRONICS CORP44 citations95
US5998251ADec 7, 1999
Process and structure for embedded DRAM
UNITED MICROELECTRONICS CORP68 citations95
US6200629B1Mar 13, 2001
Method of manufacturing multi-layer metal capacitor
UNITED MICROELECTRONICS CORP32 citations93
US6198617B1Mar 6, 2001
Multi-layer metal capacitor
UNITED MICROELECTRONICS CORP28 citations93
US6153459ANov 28, 2000
Method of fabricating dual gate structure of embedded DRAM
UNITED MICROELECTRONICS CORP19 citations93
US6143601ANov 7, 2000
Method of fabricating DRAM
UNITED MICROELECTRONICS CORP47 citations93
US6114200ASep 5, 2000
Method of fabricating a dynamic random access memory device
UNITED MICROELECTRONICS CORP32 citations93
US6025264AFeb 15, 2000
Fabricating method of a barrier layer
UNITED MICROELECTRONICS CORP32 citations93
US6015741AJan 18, 2000
Method for forming self-aligned contact window
UNITED MICROELECTRONICS CORP20 citations93
US6008100ADec 28, 1999
Metal-oxide semiconductor field effect transistor device fabrication process
UNITED MICROELECTRONICS CORP27 citations93
US5930618AJul 27, 1999
Method of Making High-K Dielectrics for embedded DRAMS
UNITED MICROELECTRONICS CORP32 citations93
US5920779AJul 6, 1999
Differential gate oxide thickness by nitrogen implantation for mixed mode and embedded VLSI circuits
UNITED MICROELECTRONICS CORP52 citations93
US5902752AMay 11, 1999
Active layer mask with dummy pattern
UNITED MICROELECTRONICS CORP53 citations93
US5886375AMar 23, 1999
SRAM having improved soft-error immunity
UNITED MICROELECTRONICS CORP42 citations93
US5874353AFeb 23, 1999
Method of forming a self-aligned silicide device
UNITED MICROELECTRONICS CORP52 citations93
US5780348AJul 14, 1998
Method of making a self-aligned silicide component
UNITED MICROELECTRONICS CORP31 citations93
US6100205AAug 8, 2000
Intermetal dielectric layer formation with low dielectric constant using high density plasma chemical vapor deposition process
UNITED MICROELECTRONICS CORP27 citations92
US5885894AMar 23, 1999
Method of planarizing an inter-layer dielectric layer
UNITED MICROELECTRONICS CORP19 citations90
US5976931ANov 2, 1999
Method for increasing capacitance
UNITED MICROELECTRONICS CORP15 citations82
US6245380B1Jun 12, 2001
Method of forming bonding pad
UNITED MICROELECTRONICS CORP10 citations74
US6242296B1Jun 5, 2001
Method of fabricating embedded DRAM
UNITED MICROELECTRONICS CORP7 citations74
MOTOROLA INC
14 patentsUS5406111AApr 11, 1995
Protection device for an intergrated circuit and method of formation
MOTOROLA INC58 citations96
US5399507AMar 21, 1995
Fabrication of mixed thin-film and bulk semiconductor substrate for integrated circuit applications
MOTOROLA INC94 citations96
US5345105ASep 6, 1994
Structure for shielding conductors
MOTOROLA INC56 citations95
US5262353ANov 16, 1993
Process for forming a structure which electrically shields conductors
MOTOROLA INC97 citations95
US4897364AJan 30, 1990
Method for locos isolation using a framed oxidation mask and a polysilicon buffer layer
MOTOROLA INC57 citations95
US5708288AJan 13, 1998
Thin film silicon on insulator semiconductor integrated circuit with electrostatic damage protection and method
MOTOROLA INC74 citations93
US5670387ASep 23, 1997
Process for forming semiconductor-on-insulator device
MOTOROLA INC46 citations93
US6017792AJan 25, 2000
Process for fabricating a semiconductor device including a nonvolatile memory cell
MOTOROLA INC35 citations92
US5545574AAug 13, 1996
Process for forming a semiconductor device having a metal-semiconductor compound
MOTOROLA INC47 citations92
US5369052ANov 29, 1994
Method of forming dual field oxide isolation
MOTOROLA INC22 citations92
US5034351AJul 23, 1991
Process for forming a feature on a substrate without recessing the surface of the substrate
MOTOROLA INC45 citations92
US5744841AApr 28, 1998
Semiconductor device with ESD protection
MOTOROLA INC41 citations90
US5733794AMar 31, 1998
Process for forming a semiconductor device with ESD protection
MOTOROLA INC22 citations90
US5605855AFeb 25, 1997
Process for fabricating a graded-channel MOS device
MOTOROLA INC50 citations89
(unassigned)
2 patentsUNITED MICROELECTRICS CORP
1 patentLIU CHIH-CHIEN
1 patentShowing the top 50 of 71 patents by PatentIndex Score.