Inventor

INADA HIROMI

JP20 patents

⚠️ This page may combine multiple inventors who share the name “INADA HIROMI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INADA HIROMI

HITACHI HIGH TECH CORP

Electric charged particle beam microscopy and electric charged particle beam microscope

Electric charged particle beam microscopy, electric charged particle beam microscope, critical dimension measurement and critical dimension measurement system

Electron microscope

Charged particle beam equipment and charged particle microscopy

Electron microscope

Scanning electron microscope

Charged particle system and a method for measuring image magnification

Charged particle beam equipment

Charged particle beam equipment

Charged particle beam equipment with magnification correction

HITACHI LTD

Method and device for observing a specimen in a field of view of an electron microscope

Method and device for observing a specimen in a field of view of an electron microscope

Method and device for observing a specimen in a field of view of an electron microscope

Method and device for observing a specimen in a field of view of an electron microscope

Method and device for observing a specimen in a field of view of an electron

INADA HIROMI

Scanning electron microscope and scanning transmission electron microscope

Charged particle beam equipment and charged particle microscopy

DENSO CORP

Method of producing ceramic body

Method of detecting defects in honeycomb structural body

NAKAMURA KUNIYASU

Scanning transmission electron microscope and axial adjustment method thereof