Inventor

TAKAO TAKAYUKI

JP2 patents

Patents

2 patents

US6639417B2Oct 28, 2003

Semiconductor parametric testing apparatus

AGILENT TECHNOLOGIES INC28 citations83

US7535243B2May 19, 2009

Method and program for controlling an apparatus for measurement of characteristics of a semiconductor device under test

AGILENT TECHNOLOGIES INC0 citations37