Inventor
SAKURAI HIRONORI
JP4 patents
⚠️ This page may combine multiple inventors who share the name “SAKURAI HIRONORI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
3 patentsUS10861145B2Dec 8, 2020
Defect inspection device and defect inspection method
HITACHI HIGH TECH CORP4 citations71
US10466181B2Nov 5, 2019
Flaw inspection device and flaw inspection method
HITACHI HIGH TECH CORP1 citations61
US10816484B2Oct 27, 2020
Flaw inspection device and flaw inspection method
HITACHI HIGH TECH CORP0 citations50