Inventor
KIM WOO-SEOP
KR13 patents
⚠️ This page may combine multiple inventors who share the name “KIM WOO-SEOP”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
11 patentsUS7598762B2Oct 6, 2009
Semiconductor driver circuit with signal swing balance and enhanced testing
SAMSUNG ELECTRONICS CO LTD22 citations91
US6972597B2Dec 6, 2005
Simultaneous bidirectional input/output circuit and method
SAMSUNG ELECTRONICS CO LTD35 citations91
US7656181B2Feb 2, 2010
Apparatus and method for testing circuit characteristics by using eye mask
SAMSUNG ELECTRONICS CO LTD11 citations81
US7692998B2Apr 6, 2010
Circuit of detecting power-up and power-down
SAMSUNG ELECTRONICS CO LTD7 citations72
US5856982AJan 5, 1999
High-speed disturb testing method and word line decoder in semiconductor memory device
SAMSUNG ELECTRONICS CO LTD8 citations71
US9026870B2May 5, 2015
Memory module and a memory test system for testing the same
SAMSUNG ELECTRONICS CO LTD2 citations62
US7512024B2Mar 31, 2009
High-speed memory device easily testable by low-speed automatic test equipment and input/output pin control method thereof
SAMSUNG ELECTRONICS CO LTD6 citations62
US7484968B2Feb 3, 2009
Socket for an electrical tester
SAMSUNG ELECTRONICS CO LTD4 citations61
US7555686B2Jun 30, 2009
Semiconductor device, test board for testing the same, and test system and method for testing the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US7436199B2Oct 14, 2008
Stack-type semiconductor package sockets and stack-type semiconductor package test systems
SAMSUNG ELECTRONICS CO LTD1 citations51
US7973400B2Jul 5, 2011
Semiconductor package having improved heat spreading performance
SAMSUNG ELECTRONICS CO LTD1 citations49