Inventor
AWAJI TOSHIAKI
JP17 patents
Patents
17 patentsUS7876120B2Jan 25, 2011
Test apparatus, pin electronics card, electrical device and switch
ADVANTEST CORP16 citations84
US7512872B2Mar 31, 2009
Test apparatus and test method
ADVANTEST CORP9 citations84
US7589549B2Sep 15, 2009
Driver circuit and test apparatus
ADVANTEST CORP9 citations81
US7707484B2Apr 27, 2010
Test apparatus and test method with features of adjusting phase difference between data and reference clock and acquiring adjusted data
ADVANTEST CORP7 citations73
US7557561B2Jul 7, 2009
Electronic device, circuit and test apparatus
ADVANTEST CORP7 citations73
US5699001ADec 16, 1997
Driver circuit for semiconductor test system
ADVANTEST CORP14 citations73
US5654655AAug 5, 1997
Driver circuit for semiconductor test system
ADVANTEST CORP12 citations73
US7965092B2Jun 21, 2011
Differential signal transmitting apparatus and a test apparatus
ADVANTEST CORP2 citations62
US7453932B2Nov 18, 2008
Test device and setting method
ADVANTEST CORP4 citations62
US7389190B2Jun 17, 2008
Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus
ADVANTEST CORP5 citations62
US7123025B2Oct 17, 2006
Differential comparator circuit, test head, and test apparatus
ADVANTEST CORP2 citations62
US6257933B1Jul 10, 2001
Connector
ADVANTEST CORP6 citations62
US7755377B2Jul 13, 2010
Driver circuit and test apparatus
ADVANTEST CORP5 citations60
US7538582B2May 26, 2009
Driver circuit, test apparatus and adjusting method
ADVANTEST CORP0 citations52
US7459897B2Dec 2, 2008
Terminator circuit, test apparatus, test head, and communication device
ADVANTEST CORP1 citations51
US7962110B2Jun 14, 2011
Driver circuit and test apparatus
ADVANTEST CORP0 citations49
US7208982B2Apr 24, 2007
Sampling circuit
ADVANTEST CORP0 citations46