Inventor
LAI XIN-JI
TW3 patents
Patents
3 patentsUS10613478B2Apr 7, 2020
Imaging method of structured illumination digital holography
UNIV NAT TAIWAN NORMAL3 citations67
US10976152B2Apr 13, 2021
Method for defect inspection of transparent substrate by integrating interference and wavefront recording to reconstruct defect complex images information
UNIV NAT TAIWAN NORMAL4 citations66
US10042325B2Aug 7, 2018
Image processing method
UNIV NAT TAIWAN NORMAL0 citations37