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Inventor
SUHANOV DENIS
IL
2 patents
Patents
2 patents
US11449711B2
Sep 20, 2022
Machine learning-based defect detection of a specimen
APPLIED MATERIALS ISRAEL LTD
2 citations
66
US11568531B2
Jan 31, 2023
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD
1 citations
58