Inventor
CHA TAE-HO
KR19 patents
⚠️ This page may combine multiple inventors who share the name “CHA TAE-HO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
10 patentsUS11069820B2Jul 20, 2021
FinFET devices having active patterns and gate spacers on field insulating layers
SAMSUNG ELECTRONICS CO LTD2 citations71
US7759263B2Jul 20, 2010
Methods for fabricating improved gate dielectrics
SAMSUNG ELECTRONICS CO LTD5 citations63
US7928498B2Apr 19, 2011
Gate structures in semiconductor devices
SAMSUNG ELECTRONICS CO LTD3 citations62
US7989892B2Aug 2, 2011
Gate structure, and semiconductor device having a gate structure
SAMSUNG ELECTRONICS CO LTD0 citations52
US7879737B2Feb 1, 2011
Methods for fabricating improved gate dielectrics
SAMSUNG ELECTRONICS CO LTD0 citations52
US7781849B2Aug 24, 2010
Semiconductor devices and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7518214B2Apr 14, 2009
Semiconductor device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US10658249B2May 19, 2020
Methods for fabricating finFET devices having gate spacers on field insulating layers
SAMSUNG ELECTRONICS CO LTD0 citations50
US7585787B2Sep 8, 2009
Semiconductor memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations42
US9412842B2Aug 9, 2016
Method for fabricating semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations41
HYNIX SEMICONDUCTOR INC
6 patentsUS6506676B2Jan 14, 2003
Method of manufacturing semiconductor devices with titanium aluminum nitride work function
HYNIX SEMICONDUCTOR INC98 citations98
US6586288B2Jul 1, 2003
Method of forming dual-metal gates in semiconductor device
HYNIX SEMICONDUCTOR INC119 citations97
US6537901B2Mar 25, 2003
Method of manufacturing a transistor in a semiconductor device
HYNIX SEMICONDUCTOR INC146 citations97
US6514827B2Feb 4, 2003
Method for fabricating a dual metal gate for a semiconductor device
HYNIX SEMICONDUCTOR INC38 citations92
US7528042B2May 5, 2009
Method for fabricating semiconductor devices having dual gate oxide layer
HYNIX SEMICONDUCTOR INC4 citations63
US7157339B2Jan 2, 2007
Method for fabricating semiconductor devices having dual gate oxide layers
HYNIX SEMICONDUCTOR INC3 citations63