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Inventor
MATSUI SHOWGO
JP
3 patents
Patents
3 patents
US6064484A
May 16, 2000
Pattern inspection method and system
FUJITSU LTD
40 citations
89
US4673816A
Jun 16, 1987
Method for inspecting a pattern and an apparatus for inspecting a pattern
FUJITSU LTD
14 citations
71
US6598185B1
Jul 22, 2003
Pattern data inspection method and storage medium
FUJITSU LTD
2 citations
55