P

Inventor

HSIEH HUNG CHANG

TW84 patents
⚠️ This page may combine multiple inventors who share the name “HSIEH HUNG CHANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG

20 patents
US9304403B2Apr 5, 2016

System and method for lithography alignment

TAIWAN SEMICONDUCTOR MFG64 citations98
US8975129B1Mar 10, 2015

Method of making a FinFET device

TAIWAN SEMICONDUCTOR MFG60 citations98
US6319821B1Nov 20, 2001

Dual damascene approach for small geometry dimension

TAIWAN SEMICONDUCTOR MFG66 citations96
US6174818B1Jan 16, 2001

Method of patterning narrow gate electrode

TAIWAN SEMICONDUCTOR MFG77 citations96
US9153483B2Oct 6, 2015

Method of semiconductor integrated circuit fabrication

TAIWAN SEMICONDUCTOR MFG28 citations94
US9034723B1May 19, 2015

Method of making a FinFET device

TAIWAN SEMICONDUCTOR MFG28 citations94
US6362093B1Mar 26, 2002

Dual damascene method employing sacrificial via fill layer

TAIWAN SEMICONDUCTOR MFG35 citations93
US6352818B1Mar 5, 2002

Photoresist development method employing multiple photoresist developer rinse

TAIWAN SEMICONDUCTOR MFG40 citations93
US6312876B1Nov 6, 2001

Method for placing identifying mark on semiconductor wafer

TAIWAN SEMICONDUCTOR MFG32 citations93
US5894350AApr 13, 1999

Method of in line intra-field correction of overlay alignment

TAIWAN SEMICONDUCTOR MFG49 citations93
US7383530B2Jun 3, 2008

System and method for examining mask pattern fidelity

TAIWAN SEMICONDUCTOR MFG27 citations92
US6242813B1Jun 5, 2001

Deep-submicron integrated circuit package for improving bondability

TAIWAN SEMICONDUCTOR MFG32 citations92
US6110816AAug 29, 2000

Method for improving bondability for deep-submicron integrated circuit package

TAIWAN SEMICONDUCTOR MFG19 citations92
US6090674AJul 18, 2000

Method of forming a hole in the sub quarter micron range

TAIWAN SEMICONDUCTOR MFG16 citations84
US6570642B2May 27, 2003

Method and apparatus for placing identifying mark on semiconductor wafer

TAIWAN SEMICONDUCTOR MFG6 citations74
US6350680B1Feb 26, 2002

Pad alignment for AlCu pad for copper process

TAIWAN SEMICONDUCTOR MFG12 citations74
US9158209B2Oct 13, 2015

Method of overlay prediction

TAIWAN SEMICONDUCTOR MFG5 citations73
US9349662B2May 24, 2016

Test structure placement on a semiconductor wafer

TAIWAN SEMICONDUCTOR MFG5 citations69
US9176387B2Nov 3, 2015

Method and apparatus for drying a wafer

TAIWAN SEMICONDUCTOR MFG2 citations63
US7897297B2Mar 1, 2011

Method and system for optimizing intra-field critical dimension uniformity using a sacrificial twin mask

TAIWAN SEMICONDUCTOR MFG3 citations63

TAIWAN SEMICONDUCTOR MFG CO LTD

17 patents
US9875892B2Jan 23, 2018

Method of forming a photoresist layer

TAIWAN SEMICONDUCTOR MFG CO LTD70 citations97
US9711367B1Jul 18, 2017

Semiconductor method with wafer edge modification

TAIWAN SEMICONDUCTOR MFG CO LTD23 citations92
US10459353B2Oct 29, 2019

Lithography system with an embedded cleaning module

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations84
US10096519B2Oct 9, 2018

Method of making a FinFET device

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations83
US9799567B2Oct 24, 2017

Method of forming source/drain contact

TAIWAN SEMICONDUCTOR MFG CO LTD8 citations83
US9437497B2Sep 6, 2016

Method of making a FinFET device

TAIWAN SEMICONDUCTOR MFG CO LTD8 citations80
US10672656B2Jun 2, 2020

Method of semiconductor integrated circuit fabrication

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9466486B2Oct 11, 2016

Method for integrated circuit patterning

TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US11081394B2Aug 3, 2021

Method of making a FinFET device

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US10163720B2Dec 25, 2018

Method of forming source/drain contact

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US9823574B2Nov 21, 2017

Lithography alignment marks

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US9703918B2Jul 11, 2017

Two-dimensional process window improvement

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US9805154B2Oct 31, 2017

Method of lithography process with inserting scattering bars

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations68
US9443768B2Sep 13, 2016

Method of making a FinFET device

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations63
US11735477B2Aug 22, 2023

Method of semiconductor integrated circuit fabrication

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11378894B2Jul 5, 2022

Lithography system with an embedded cleaning module

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US8972912B1Mar 3, 2015

Structure for chip extension

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations62

DELTA ELECTRONICS INC

6 patents

CHANG CHUN-WEI

1 patent

WANG CHIH-CHIEN

1 patent

LAN SHUN-WEI

1 patent

YU VINVENT

1 patent

YU VINCENT

1 patent

LEE HSIN-CHANG

1 patent

HUANG WEI-CHIEH

1 patent

Showing the top 50 of 84 patents by PatentIndex Score.