Inventor

WANG JILL

TW2 patents

⚠️ This page may combine multiple inventors who share the name “WANG JILL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TSEN ANDY

1 patent

US8108060B2Jan 31, 2012

System and method for implementing a wafer acceptance test (“WAT”) advanced process control (“APC”) with novel sampling policy and architecture

TSEN ANDY25 citations90

FEI WANG JO

1 patent

US8392009B2Mar 5, 2013

Advanced process control with novel sampling policy

FEI WANG JO4 citations54