Inventor
KU WEI-CHENG
TW39 patents
⚠️ This page may combine multiple inventors who share the name “KU WEI-CHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MPI CORP
29 patentsUS7595651B2Sep 29, 2009
Cantilever-type probe card for high frequency application
MPI CORP24 citations88
US7791359B2Sep 7, 2010
Probe for high frequency signal transmission and probe card using the same
MPI CORP11 citations82
US7683645B2Mar 23, 2010
High-frequency probe card and transmission line for high-frequency probe card
MPI CORP11 citations82
US10295567B2May 21, 2019
Probe module supporting loopback test
MPI CORP2 citations72
US10070512B2Sep 4, 2018
Multilayer circuit board
MPI CORP4 citations72
US9658249B2May 23, 2017
Probe card capable of transmitting high-frequency signals
MPI CORP2 citations72
US9596769B2Mar 14, 2017
Multilayer circuit board
MPI CORP5 citations72
US9316685B2Apr 19, 2016
Probe card of low power loss
MPI CORP4 citations72
US9759746B2Sep 12, 2017
Probe module
MPI CORP2 citations67
US9442134B2Sep 13, 2016
Signal path switch and probe card having the signal path switch
MPI CORP2 citations60
US7724009B2May 25, 2010
Method of making high-frequency probe, probe card using the high-frequency probe
MPI CORP3 citations58
US9927487B2Mar 27, 2018
Probe card having configurable structure for exchanging or swapping electronic components for impedance matching
MPI CORP0 citations51
US9545002B2Jan 10, 2017
Multilayer circuit board
MPI CORP0 citations51
US9645197B2May 9, 2017
Method of operating testing system
MPI CORP0 citations50
US9519010B2Dec 13, 2016
Integrated high-speed probe system
MPI CORP0 citations50
US9500675B2Nov 22, 2016
Probe module supporting loopback test
MPI CORP1 citations47
US9459279B2Oct 4, 2016
Electrical testing machine
MPI CORP1 citations47
US11536765B2Dec 27, 2022
Probing apparatus
MPI CORP0 citations41
US10101362B2Oct 16, 2018
Probe module with high stability
MPI CORP0 citations41
US10067163B2Sep 4, 2018
Probe card capable of transmitting high-frequency signals
MPI CORP0 citations41
US9835651B2Dec 5, 2017
Cantilever type probe card for high frequency signal transmission
MPI CORP0 citations41
US10054627B2Aug 21, 2018
Testing jig
MPI CORP0 citations39
US9880252B2Jan 30, 2018
Method of calibrating and debugging testing system
MPI CORP0 citations39
US9759743B2Sep 12, 2017
Testing system and method for testing of electrical connections
MPI CORP0 citations39
US9581676B2Feb 28, 2017
Method of calibrating and debugging testing system
MPI CORP0 citations39
US9410986B2Aug 9, 2016
Testing jig
MPI CORP0 citations39
US9523708B2Dec 20, 2016
Electrical testing device
MPI CORP0 citations36
US9622348B2Apr 11, 2017
Multilayer circuit board
MPI CORP0 citations34
US9470716B2Oct 18, 2016
Probe module
MPI CORP0 citations34
KU WEI-CHENG
3 patentsUS8648739B2Feb 11, 2014
Transmission interface and system using the same
KU WEI-CHENG0 citations46
US8106673B2Jan 31, 2012
Probe for high frequency signal transmission
KU WEI-CHENG0 citations46
US8816713B2Aug 26, 2014
Probe card having adjustable high frequency signal transmission path for transmission of high frequency signal
KU WEI-CHENG0 citations31