P

Inventor

DAMIANO JR JOHN

US57 patents
⚠️ This page may combine multiple inventors who share the name “DAMIANO JR JOHN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

PROTOCHIPS INC

36 patents
USD806892SJan 2, 2018

Tip of a sample holder

PROTOCHIPS INC20 citations94
USD841183SFeb 19, 2019

Window E-chip for an electron microscope

PROTOCHIPS INC25 citations93
US9324539B2Apr 26, 2016

Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

PROTOCHIPS INC14 citations92
US7713053B2May 11, 2010

Reusable template for creation of thin films; method of making and using template; and thin films produced from template

PROTOCHIPS INC26 citations92
US9466459B2Oct 11, 2016

Method for optimizing fluid flow across a sample within an electron microscope sample holder

PROTOCHIPS INC11 citations84
US9275826B2Mar 1, 2016

Microscopy support structures

PROTOCHIPS INC5 citations84
US9437393B2Sep 6, 2016

Method for forming an electrical connection to an sample support in an electron microscope holder

PROTOCHIPS INC11 citations83
US9312097B2Apr 12, 2016

Specimen holder used for mounting samples in electron microscopes

PROTOCHIPS INC7 citations82
US8859991B2Oct 14, 2014

Specimen holder used for mounting samples in electron microscopes

PROTOCHIPS INC5 citations82
US8853646B2Oct 7, 2014

Specimen holder used for mounting samples in electron microscopes

PROTOCHIPS INC5 citations82
US10373800B2Aug 6, 2019

Method for optimizing fluid flow across a sample within an electron microscope sample holder

PROTOCHIPS INC3 citations73
US10014154B2Jul 3, 2018

Method for enabling modular part replacement within an electron microscope sample holder

PROTOCHIPS INC2 citations73
US9837746B2Dec 5, 2017

Method for forming an electrical connection to a sample support in an electron microscope holder

PROTOCHIPS INC2 citations73
US9666409B2May 30, 2017

Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

PROTOCHIPS INC3 citations73
US10986279B1Apr 20, 2021

Automated application of drift correction to sample studied under electron microscope

PROTOCHIPS INC2 citations72
US9818578B2Nov 14, 2017

Device for monitoring environmental states of a microscope sample with an electron microscope sample holder

PROTOCHIPS INC3 citations72
US12130858B2Oct 29, 2024

Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

PROTOCHIPS INC1 citations71
US11902665B2Feb 13, 2024

Automated application of drift correction to sample studied under electron microscope

PROTOCHIPS INC4 citations71
US8872128B2Oct 28, 2014

Sample holder providing interface to semiconductor device with high density connections

PROTOCHIPS INC4 citations71
US11869744B2Jan 9, 2024

Electron microscope sample holder fluid handling with independent pressure and flow control

PROTOCHIPS INC0 citations62
US11222765B2Jan 11, 2022

Electron microscope sample holder fluid handling with independent pressure and flow control

PROTOCHIPS INC0 citations62
US11170968B2Nov 9, 2021

MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samples

PROTOCHIPS INC0 citations62
US10128079B2Nov 13, 2018

MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples

PROTOCHIPS INC1 citations62
US12375815B2Jul 29, 2025

Automated application of drift correction to sample studied under electron microscope

PROTOCHIPS INC0 citations61
US12010430B2Jun 11, 2024

Automated application of drift correction to sample studied under electron microscope

PROTOCHIPS INC0 citations61
US11477388B2Oct 18, 2022

Automated application of drift correction to sample studied under electron microscope

PROTOCHIPS INC0 citations61
US11399138B2Jul 26, 2022

Automated application of drift correction to sample studied under electron microscope

PROTOCHIPS INC0 citations61
US11755639B2Sep 12, 2023

Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

PROTOCHIPS INC0 citations60
US11455333B1Sep 27, 2022

Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

PROTOCHIPS INC0 citations60
US12284445B2Apr 22, 2025

Automated application of drift correction to sample studied under electron microscope

PROTOCHIPS INC0 citations59
US11514586B1Nov 29, 2022

Automated application of drift correction to sample studied under electron microscope

PROTOCHIPS INC0 citations59
US10586679B2Mar 10, 2020

Method for enabling modular part replacement within an electron microscope sample holder

PROTOCHIPS INC0 citations52
US10192714B2Jan 29, 2019

Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

PROTOCHIPS INC0 citations52
US10043633B2Aug 7, 2018

Electron microscope sample holder for forming a gas or liquid cell with two semiconductor devices

PROTOCHIPS INC0 citations52
US9997330B2Jun 12, 2018

Method for optimizing fluid flow across a sample within an electron microscope sample holder

PROTOCHIPS INC0 citations52
US9984850B2May 29, 2018

Microscopy support structures

PROTOCHIPS INC0 citations52

MICRON TECHNOLOGY INC

6 patents

DAMIANO JR JOHN

5 patents

UNIV NORTH CAROLINA STATE

2 patents

NACKASHI DAVID P

1 patent

Showing the top 50 of 57 patents by PatentIndex Score.