Inventor

ZUO KEWEI

TW20 patents

⚠️ This page may combine multiple inventors who share the name “ZUO KEWEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ZUO KEWEI

TAIWAN SEMICONDUCTOR MFG CO LTD

Die-tracing in integrated circuit manufacturing and packaging

Machine learning on overlay management

Machine learning on overlay virtual metrology

System and method for automatic quality control for assembly line processes

Machine learning on overlay management

Machine learning on overlay management

Near non-adaptive virtual metrology and chamber control

Clustering for prediction models in process control and for optimal dispatching

Temperature controlled loadlock chamber

TAIWAN SEMICONDUCTOR MFG

System for extraction of key process parameters from fault detection classification to enable wafer prediction

System and method to improve package and 3DIC yield in underfill process

Method and apparatus for thinning a substrate

KO FRANCIS

Automatic virtual metrology for semiconductor wafer result prediction

Clustering for prediction models in process control and for optimal dispatching

WANG CHIEN RHONE

Packaging methods, material dispensing methods and apparatuses, and automated measurement systems

System and method for through silicon via yield

WANG AMY

Near non-adaptive virtual metrology and chamber control

YU CHEN-HUA

Solder joint reflow process for reducing packaging failure rate

SUNG CHIEN-MING

Preventing contamination in integrated circuit manufacturing lines

LIN CHUN-HSIEN

Temperature controlled loadlock chamber