Inventor
LAI CHIH-WEI
TW26 patents
⚠️ This page may combine multiple inventors who share the name “LAI CHIH-WEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
EMEMORY TECHNOLOGY INC
7 patentsUS10546619B2Jan 28, 2020
Electrostatic discharge circuit
EMEMORY TECHNOLOGY INC4 citations82
US11508719B2Nov 22, 2022
Electrostatic discharge circuit
EMEMORY TECHNOLOGY INC3 citations70
US11462903B2Oct 4, 2022
Electrostatic discharge (ESD) circuit capable of protecting internal circuit from being affected by ESD zapping
EMEMORY TECHNOLOGY INC2 citations70
US11025054B2Jun 1, 2021
Electrostatic discharge protection device
EMEMORY TECHNOLOGY INC4 citations70
US10944258B2Mar 9, 2021
RC circuit triggered electrostatic discharge circuit
EMEMORY TECHNOLOGY INC2 citations70
US12376294B2Jul 29, 2025
Electrostatic discharge circuit
EMEMORY TECHNOLOGY INC0 citations59
US11616360B2Mar 28, 2023
Integrated circuit with capability of inhibiting ESD zap
EMEMORY TECHNOLOGY INC0 citations49
TAIWAN SEMICONDUCTOR MFG CO LTD
4 patentsUS9430605B2Aug 30, 2016
Adjusting sizes of connectors of package components
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US9390491B2Jul 12, 2016
System and method for automatic quality control for assembly line processes
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations61
US9588505B2Mar 7, 2017
Near non-adaptive virtual metrology and chamber control
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10054938B2Aug 21, 2018
Clustering for prediction models in process control and for optimal dispatching
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations48
TAIWAN SEMICONDUCTOR MFG
3 patentsUS7634325B2Dec 15, 2009
Prediction of uniformity of a wafer
TAIWAN SEMICONDUCTOR MFG12 citations83
US7767471B2Aug 3, 2010
Auto routing for optimal uniformity control
TAIWAN SEMICONDUCTOR MFG3 citations62
US9111064B2Aug 18, 2015
Adjusting sizes of connectors of package components
TAIWAN SEMICONDUCTOR MFG0 citations51
KO FRANCIS
3 patentsUS8682466B2Mar 25, 2014
Automatic virtual metrology for semiconductor wafer result prediction
KO FRANCIS13 citations81
US8409993B2Apr 2, 2013
Method and system for controlling copper chemical mechanical polish uniformity
KO FRANCIS2 citations61
US9037279B2May 19, 2015
Clustering for prediction models in process control and for optimal dispatching
KO FRANCIS1 citations51