Inventor
PENG YENG-KAUNG
US6 patents
Patents
6 patentsUS5787190AJul 28, 1998
Method and apparatus for pattern recognition of wafer test bins
ADVANCED MICRO DEVICES INC230 citations97
US6028994AFeb 22, 2000
Method for predicting performance of microelectronic device based on electrical parameter test data using computer model
ADVANCED MICRO DEVICES INC67 citations94
US5598341AJan 28, 1997
Real-time in-line defect disposition and yield forecasting system
ADVANCED MICRO DEVICES INC82 citations94
US5886909AMar 23, 1999
Defect diagnosis using simulation for IC yield improvement
ADVANCED MICRO DEVICES INC33 citations89
US5822717AOct 13, 1998
Method and apparatus for automated wafer level testing and reliability data analysis
ADVANCED MICRO DEVICES INC34 citations89
US5561293AOct 1, 1996
Method of failure analysis with CAD layout navigation and FIB/SEM inspection
ADVANCED MICRO DEVICES INC50 citations85