P

Inventor

SADOVNIKOV ALEXEI

US67 patents
⚠️ This page may combine multiple inventors who share the name “SADOVNIKOV ALEXEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TEXAS INSTRUMENTS INC

37 patents
US10163680B1Dec 25, 2018

Sinker to buried layer connection region for narrow deep trenches

TEXAS INSTRUMENTS INC16 citations89
US10269895B2Apr 23, 2019

Method for creating the high voltage complementary BJT with lateral collector on bulk substrate with resurf effect

TEXAS INSTRUMENTS INC7 citations84
US9786665B1Oct 10, 2017

Dual deep trenches for high voltage isolation

TEXAS INSTRUMENTS INC7 citations84
US9741790B2Aug 22, 2017

Method for creating the high voltage complementary BJT with lateral collector on bulk substrate with resurf effect

TEXAS INSTRUMENTS INC5 citations84
US9633995B2Apr 25, 2017

Method of forming a gate shield in an ED-CMOS transistor and a base of a bipolar transistor using BICMOS technologies

TEXAS INSTRUMENTS INC7 citations84
US9633994B2Apr 25, 2017

BICMOS device having commonly defined gate shield in an ED-CMOS transistor and base in a bipolar transistor

TEXAS INSTRUMENTS INC11 citations84
US9306013B2Apr 5, 2016

Method of forming a gate shield in an ED-CMOS transistor and a base of a bipolar transistor using BICMOS technologies

TEXAS INSTRUMENTS INC6 citations84
US10811543B2Oct 20, 2020

Semiconductor device with deep trench isolation and trench capacitor

TEXAS INSTRUMENTS INC6 citations83
US10224402B2Mar 5, 2019

Method of improving lateral BJT characteristics in BCD technology

TEXAS INSTRUMENTS INC8 citations83
US11195958B2Dec 7, 2021

Semiconductor device with deep trench isolation and trench capacitor

TEXAS INSTRUMENTS INC3 citations72
US9905428B2Feb 27, 2018

Split-gate lateral extended drain MOS transistor structure and process

TEXAS INSTRUMENTS INC5 citations72
US10978559B1Apr 13, 2021

MOS transistor with folded channel and folded drift region

TEXAS INSTRUMENTS INC5 citations71
US9773777B2Sep 26, 2017

Low dynamic resistance low capacitance diodes

TEXAS INSTRUMENTS INC3 citations71
US11152505B2Oct 19, 2021

Drain extended transistor

TEXAS INSTRUMENTS INC2 citations68
US12113128B2Oct 8, 2024

DMOS transistor having thick gate oxide and STI and method of fabricating

TEXAS INSTRUMENTS INC0 citations62
US12015057B2Jun 18, 2024

Carbon, nitrogen and/or fluorine co-implants for low resistance transistors

TEXAS INSTRUMENTS INC0 citations62
US11791405B2Oct 17, 2023

Transistor having an emitter region with a silicide spaced apart from a base contact

TEXAS INSTRUMENTS INC0 citations62
US11588019B2Feb 21, 2023

Bipolar junction transistor with constricted collector region having high gain and early voltage product

TEXAS INSTRUMENTS INC0 citations62
US11217665B2Jan 4, 2022

Bipolar junction transistor with constricted collector region having high gain and early voltage product

TEXAS INSTRUMENTS INC0 citations62
US11094806B2Aug 17, 2021

Fabricating transistors with implanting dopants at first and second dosages in the collector region to form the base region

TEXAS INSTRUMENTS INC1 citations62
US11049967B2Jun 29, 2021

DMOS transistor having thick gate oxide and STI and method of fabricating

TEXAS INSTRUMENTS INC0 citations62
US11024649B2Jun 1, 2021

Integrated circuit with resurf region biasing under buried insulator layers

TEXAS INSTRUMENTS INC0 citations62
US12520542B2Jan 6, 2026

Corrugated metal oxide semiconductor transistor

TEXAS INSTRUMENTS INC0 citations61
US12363926B2Jul 15, 2025

Vertical deep trench and deep trench island based deep n-type well diode and diode triggered protection device

TEXAS INSTRUMENTS INC0 citations61
US12218190B2Feb 4, 2025

False collectors and guard rings for semiconductor devices

TEXAS INSTRUMENTS INC0 citations61
US11869986B2Jan 9, 2024

Vertical deep trench and deep trench island based deep n-type well diode and diode triggered protection device

TEXAS INSTRUMENTS INC0 citations61
US11527617B2Dec 13, 2022

MOS transistor with folded channel and folded drift region

TEXAS INSTRUMENTS INC0 citations61
US11081558B2Aug 3, 2021

LDMOS with high-k drain STI dielectric

TEXAS INSTRUMENTS INC0 citations60
US12211807B2Jan 28, 2025

Semiconductor doped region with biased isolated members

TEXAS INSTRUMENTS INC0 citations59
US11830830B2Nov 28, 2023

Semiconductor doped region with biased isolated members

TEXAS INSTRUMENTS INC0 citations59
US10886160B2Jan 5, 2021

Sinker to buried layer connection region for narrow deep trenches

TEXAS INSTRUMENTS INC0 citations59
US12327829B2Jun 10, 2025

Rugged LDMOS with field plate

TEXAS INSTRUMENTS INC1 citations58
US10522663B2Dec 31, 2019

Integrated JFET structure with implanted backgate

TEXAS INSTRUMENTS INC1 citations57
US12501633B2Dec 16, 2025

Breakdown diodes and methods of making the same

TEXAS INSTRUMENTS INC0 citations52
US10636815B2Apr 28, 2020

Integrated circuit with resurf region biasing under buried insulator layers

TEXAS INSTRUMENTS INC0 citations52
US10580775B2Mar 3, 2020

Dual deep trenches for high voltage isolation

TEXAS INSTRUMENTS INC0 citations52
US10504921B2Dec 10, 2019

Integrated circuit with resurf region biasing under buried insulator layers

TEXAS INSTRUMENTS INC0 citations52

NAT SEMICONDUCTOR CORP

10 patents
US7132342B1Nov 7, 2006

Method of reducing fringing capacitance in a MOSFET

NAT SEMICONDUCTOR CORP20 citations93
US6964907B1Nov 15, 2005

Method of etching a lateral trench under an extrinsic base and improved bipolar transistor

NAT SEMICONDUCTOR CORP36 citations93
US7687887B1Mar 30, 2010

Method of forming a self-aligned bipolar transistor structure using a selectively grown emitter

NAT SEMICONDUCTOR CORP39 citations92
US6380017B1Apr 30, 2002

Polysilicon-edge, base-emitter super self-aligned, low-power, high-frequency bipolar transistor and method of forming the transistor

NAT SEMICONDUCTOR CORP20 citations92
US6699741B1Mar 2, 2004

Single poly bipolar transistor and method that uses a selectively epitaxially grown highly-boron-doped silicon layer as a diffusion source for an extrinsic base region

NAT SEMICONDUCTOR CORP20 citations86
US6475848B1Nov 5, 2002

Polysilicon-edge, low-power, high-frequency bipolar transistor and method of forming the transistor

NAT SEMICONDUCTOR CORP14 citations84
US6967144B1Nov 22, 2005

Low doped base spacer for reduction of emitter-base capacitance in bipolar transistors with selectively grown epitaxial base

NAT SEMICONDUCTOR CORP9 citations74
US6603188B1Aug 5, 2003

Polysilicon-edge, low-power, high-frequency bipolar transistor and method of forming the transistor

NAT SEMICONDUCTOR CORP8 citations73
US7714355B1May 11, 2010

Method of controlling the breakdown voltage of BSCRs and BJT clamps

NAT SEMICONDUCTOR CORP2 citations63
US6528862B1Mar 4, 2003

Bipolar transistor with a box-type germanium profile that lies outside of the emitter-base depletion region

NAT SEMICONDUCTOR CORP6 citations63

EL-DIWANY MONIR

1 patent

FOOTE RICHARD W

1 patent

BABCOCK JEFFREY A

1 patent

Showing the top 50 of 67 patents by PatentIndex Score.