Inventor
SADOVNIKOV ALEXEI
US67 patents
⚠️ This page may combine multiple inventors who share the name “SADOVNIKOV ALEXEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TEXAS INSTRUMENTS INC
37 patentsUS10163680B1Dec 25, 2018
Sinker to buried layer connection region for narrow deep trenches
TEXAS INSTRUMENTS INC16 citations89
US10269895B2Apr 23, 2019
Method for creating the high voltage complementary BJT with lateral collector on bulk substrate with resurf effect
TEXAS INSTRUMENTS INC7 citations84
US9786665B1Oct 10, 2017
Dual deep trenches for high voltage isolation
TEXAS INSTRUMENTS INC7 citations84
US9741790B2Aug 22, 2017
Method for creating the high voltage complementary BJT with lateral collector on bulk substrate with resurf effect
TEXAS INSTRUMENTS INC5 citations84
US9633995B2Apr 25, 2017
Method of forming a gate shield in an ED-CMOS transistor and a base of a bipolar transistor using BICMOS technologies
TEXAS INSTRUMENTS INC7 citations84
US9633994B2Apr 25, 2017
BICMOS device having commonly defined gate shield in an ED-CMOS transistor and base in a bipolar transistor
TEXAS INSTRUMENTS INC11 citations84
US9306013B2Apr 5, 2016
Method of forming a gate shield in an ED-CMOS transistor and a base of a bipolar transistor using BICMOS technologies
TEXAS INSTRUMENTS INC6 citations84
US10811543B2Oct 20, 2020
Semiconductor device with deep trench isolation and trench capacitor
TEXAS INSTRUMENTS INC6 citations83
US10224402B2Mar 5, 2019
Method of improving lateral BJT characteristics in BCD technology
TEXAS INSTRUMENTS INC8 citations83
US11195958B2Dec 7, 2021
Semiconductor device with deep trench isolation and trench capacitor
TEXAS INSTRUMENTS INC3 citations72
US9905428B2Feb 27, 2018
Split-gate lateral extended drain MOS transistor structure and process
TEXAS INSTRUMENTS INC5 citations72
US10978559B1Apr 13, 2021
MOS transistor with folded channel and folded drift region
TEXAS INSTRUMENTS INC5 citations71
US9773777B2Sep 26, 2017
Low dynamic resistance low capacitance diodes
TEXAS INSTRUMENTS INC3 citations71
US11152505B2Oct 19, 2021
Drain extended transistor
TEXAS INSTRUMENTS INC2 citations68
US12113128B2Oct 8, 2024
DMOS transistor having thick gate oxide and STI and method of fabricating
TEXAS INSTRUMENTS INC0 citations62
US12015057B2Jun 18, 2024
Carbon, nitrogen and/or fluorine co-implants for low resistance transistors
TEXAS INSTRUMENTS INC0 citations62
US11791405B2Oct 17, 2023
Transistor having an emitter region with a silicide spaced apart from a base contact
TEXAS INSTRUMENTS INC0 citations62
US11588019B2Feb 21, 2023
Bipolar junction transistor with constricted collector region having high gain and early voltage product
TEXAS INSTRUMENTS INC0 citations62
US11217665B2Jan 4, 2022
Bipolar junction transistor with constricted collector region having high gain and early voltage product
TEXAS INSTRUMENTS INC0 citations62
US11094806B2Aug 17, 2021
Fabricating transistors with implanting dopants at first and second dosages in the collector region to form the base region
TEXAS INSTRUMENTS INC1 citations62
US11049967B2Jun 29, 2021
DMOS transistor having thick gate oxide and STI and method of fabricating
TEXAS INSTRUMENTS INC0 citations62
US11024649B2Jun 1, 2021
Integrated circuit with resurf region biasing under buried insulator layers
TEXAS INSTRUMENTS INC0 citations62
US12520542B2Jan 6, 2026
Corrugated metal oxide semiconductor transistor
TEXAS INSTRUMENTS INC0 citations61
US12363926B2Jul 15, 2025
Vertical deep trench and deep trench island based deep n-type well diode and diode triggered protection device
TEXAS INSTRUMENTS INC0 citations61
US12218190B2Feb 4, 2025
False collectors and guard rings for semiconductor devices
TEXAS INSTRUMENTS INC0 citations61
US11869986B2Jan 9, 2024
Vertical deep trench and deep trench island based deep n-type well diode and diode triggered protection device
TEXAS INSTRUMENTS INC0 citations61
US11527617B2Dec 13, 2022
MOS transistor with folded channel and folded drift region
TEXAS INSTRUMENTS INC0 citations61
US11081558B2Aug 3, 2021
LDMOS with high-k drain STI dielectric
TEXAS INSTRUMENTS INC0 citations60
US12211807B2Jan 28, 2025
Semiconductor doped region with biased isolated members
TEXAS INSTRUMENTS INC0 citations59
US11830830B2Nov 28, 2023
Semiconductor doped region with biased isolated members
TEXAS INSTRUMENTS INC0 citations59
US10886160B2Jan 5, 2021
Sinker to buried layer connection region for narrow deep trenches
TEXAS INSTRUMENTS INC0 citations59
US12327829B2Jun 10, 2025
Rugged LDMOS with field plate
TEXAS INSTRUMENTS INC1 citations58
US10522663B2Dec 31, 2019
Integrated JFET structure with implanted backgate
TEXAS INSTRUMENTS INC1 citations57
US12501633B2Dec 16, 2025
Breakdown diodes and methods of making the same
TEXAS INSTRUMENTS INC0 citations52
US10636815B2Apr 28, 2020
Integrated circuit with resurf region biasing under buried insulator layers
TEXAS INSTRUMENTS INC0 citations52
US10580775B2Mar 3, 2020
Dual deep trenches for high voltage isolation
TEXAS INSTRUMENTS INC0 citations52
US10504921B2Dec 10, 2019
Integrated circuit with resurf region biasing under buried insulator layers
TEXAS INSTRUMENTS INC0 citations52
NAT SEMICONDUCTOR CORP
10 patentsUS7132342B1Nov 7, 2006
Method of reducing fringing capacitance in a MOSFET
NAT SEMICONDUCTOR CORP20 citations93
US6964907B1Nov 15, 2005
Method of etching a lateral trench under an extrinsic base and improved bipolar transistor
NAT SEMICONDUCTOR CORP36 citations93
US7687887B1Mar 30, 2010
Method of forming a self-aligned bipolar transistor structure using a selectively grown emitter
NAT SEMICONDUCTOR CORP39 citations92
US6380017B1Apr 30, 2002
Polysilicon-edge, base-emitter super self-aligned, low-power, high-frequency bipolar transistor and method of forming the transistor
NAT SEMICONDUCTOR CORP20 citations92
US6699741B1Mar 2, 2004
Single poly bipolar transistor and method that uses a selectively epitaxially grown highly-boron-doped silicon layer as a diffusion source for an extrinsic base region
NAT SEMICONDUCTOR CORP20 citations86
US6475848B1Nov 5, 2002
Polysilicon-edge, low-power, high-frequency bipolar transistor and method of forming the transistor
NAT SEMICONDUCTOR CORP14 citations84
US6967144B1Nov 22, 2005
Low doped base spacer for reduction of emitter-base capacitance in bipolar transistors with selectively grown epitaxial base
NAT SEMICONDUCTOR CORP9 citations74
US6603188B1Aug 5, 2003
Polysilicon-edge, low-power, high-frequency bipolar transistor and method of forming the transistor
NAT SEMICONDUCTOR CORP8 citations73
US7714355B1May 11, 2010
Method of controlling the breakdown voltage of BSCRs and BJT clamps
NAT SEMICONDUCTOR CORP2 citations63
US6528862B1Mar 4, 2003
Bipolar transistor with a box-type germanium profile that lies outside of the emitter-base depletion region
NAT SEMICONDUCTOR CORP6 citations63
EL-DIWANY MONIR
1 patentFOOTE RICHARD W
1 patentBABCOCK JEFFREY A
1 patentShowing the top 50 of 67 patents by PatentIndex Score.