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Inventor
CHANG HUAN-YUNG
TW
2 patents
⚠️ This page may combine multiple inventors who share the name “CHANG HUAN-YUNG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
1 patent
US6973390B2
Dec 6, 2005
Method and system for analyzing wafer yield against uses of a semiconductor tool
TAIWAN SEMICONDUCTOR MFG
2 citations
48
LEU I-YUN
1 patent
US8160830B2
Apr 17, 2012
Method of yield management for semiconductor manufacture and apparatus thereof
LEU I-YUN
0 citations
36