Inventor
LAI YUEH-YI
TW4 patents
Patents
4 patentsUS10008005B2Jun 26, 2018
Measurement system and method for measuring multi-dimensions
IND TECH RES INST4 citations64
US11162784B2Nov 2, 2021
Profile measurement system and profile measurement method
IND TECH RES INST1 citations57
US12412281B2Sep 9, 2025
Method and system for remote sharing three dimensional space annotation trajectory
IND TECH RES INST0 citations37
US10571252B2Feb 25, 2020
Surface topography optical measuring system and surface topography optical measuring method
IND TECH RES INST0 citations36