Inventor · disambiguated record
Michiie Sakamoto
Also filed as: SAKAMOTO MICHIIE
11 granted patents·2 pending applications·19 citations·filing 2012–2019
84Inventor score
Top patents by PatentIndex Score
13 records- 0191US10527836B2Microscope system, control method, and programCANON KK·Filed 2015·Granted Jan 7, 2020·8 cites·14 claims
- 0274US10928620B2Microscope system and method of controlling the sameCANON KK·Filed 2016·Granted Feb 23, 2021·2 cites·18 claims
- 0374US10838187B2Slide, set of slide and cover glass, and microscope systemCANON KK·Filed 2016·Granted Nov 17, 2020·2 cites·14 claims
- 0473US10634897B2Microscope system and control method thereofCANON KK·Filed 2015·Granted Apr 28, 2020·2 cites·25 claims
- 0572US10732397B2Microscope system, control method thereof, and programCANON KK·Filed 2015·Granted Aug 4, 2020·2 cites·10 claims
- 0672US10725309B2Microscope systemCANON KK·Filed 2015·Granted Jul 28, 2020·2 cites·20 claims
- 0765US11009693B2Microscope systemCANON KK·Filed 2016·Granted May 18, 2021·1 cites·22 claims
- 0863US11287632B2Microscope system, control method, and programCANON KK·Filed 2019·Granted Mar 29, 2022·0 cites·8 claims
- 0944US9916658B2Disease analysis apparatus, control method, and programNEC CORP·Filed 2014·Granted Mar 13, 2018·0 cites·15 claims
- 1040US9286670B2Pathological diagnosis assisting apparatus, pathological diagnosis assisting method and non-transitory computer readable medium storing pathological diagnosis assisting programUNIV KEIO·Filed 2012·Granted Mar 15, 2016·0 cites·4 claims
- 1139US9224199B2Pathological diagnosis assisting apparatus, pathological diagnosis assisting method and non-transitory computer readable medium storing pathological diagnosis assisting programUNIV KEIO·Filed 2012·Granted Dec 29, 2015·0 cites·4 claims
- 1239US2017261737A1Slide and microscope system using the slideCANON KK·Filed 2015·Application pending·0 cites
- 1338US2018373015A1Microscope system and method of controlling the sameCANON KK·Filed 2016·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →