Inventor

TANIMURA MASAAKI

JP10 patents

⚠️ This page may combine multiple inventors who share the name “TANIMURA MASAAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

RENESAS TECH CORP

4 patents

US6750672B2Jun 15, 2004

Semiconductor inspecting system for inspecting a semiconductor integrated circuit device, and semiconductor inspecting method using the same

RENESAS TECH CORP19 citations92

US7222279B2May 22, 2007

Semiconductor integrated circuit and test system for testing the same

RENESAS TECH CORP10 citations82

US6784684B2Aug 31, 2004

Testing apparatus including testing board having wirings connected to common point and method of testing semiconductor device by composing signals

RENESAS TECH CORP14 citations82

US6774657B2Aug 10, 2004

Apparatus and method of inspecting semiconductor integrated circuit

RENESAS TECH CORP6 citations62

MITSUBISHI ELECTRIC CORP

3 patents

US5880998AMar 9, 1999

Synchronous semiconductor memory device in which current consumed by input buffer circuit is reduced

MITSUBISHI ELECTRIC CORP108 citations97

US6479363B1Nov 12, 2002

Semiconductor integrated circuit and method for testing the same

MITSUBISHI ELECTRIC CORP9 citations72

US6317373B1Nov 13, 2001

Semiconductor memory device having a test mode and semiconductor testing method utilizing the same

MITSUBISHI ELECTRIC CORP12 citations72

RENESAS ELECTRONICS CORP