Inventor · disambiguated record
Markus Glatthaar
Also filed as: GLATTHAAR MARKUS
3 granted patents·5 pending applications·1 citations·filing 2010–2022
45Inventor score
Top patents by PatentIndex Score
8 records- 0154US2023014707A1Method for producing electrical contacts on a componentFRAUNHOFER GES FORSCHUNG·Filed 2022·Application pending·0 cites
- 0254US2016240699A1Method for structuring layers of oxidizable materials by means of oxidation and substrate having a structured coatingFRAUNHOFER GES FORSCHUNG·Filed 2014·Application pending·0 cites
- 0350US2018040744A1Method for structuring layers of oxidizable materials by means of oxidation and substrate having a structured coatingFRAUNHOFER GES FORSCHUNG·Filed 2017·Application pending·0 cites
- 0449US9435740B2Method for measuring a semiconductor structure, which is a solar cell or a precursor of a solar cellHAUNSCHILD JONAS·Filed 2010·Granted Sep 6, 2016·1 cites·15 claims
- 0537US10808330B2Process for metallizing a componentFRAUNHOFER GES FORSCHUNG·Filed 2019·Granted Oct 20, 2020·0 cites·13 claims
- 0636US2019237599A1Method for producing electrical contacts on a componentFRAUNHOFER GES FORSCHUNG·Filed 2017·Application pending·0 cites
- 0726US2012074971A1Measuring device for electrically measuring a flat measurement structure that can be contacted on one sideGLATTHAAR MARKUS·Filed 2010·Application pending·0 cites
- 0823US9124214B2Method for spatially determining the series resistance of a semiconductor structureHAUNSCHILD JONAS·Filed 2010·Granted Sep 1, 2015·0 cites·10 claims
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