Inventor
HSU HUO-KANG
TW5 patents
Patents
5 patentsUS9643271B2May 9, 2017
Method for making support structure for probing device
MPI CORP2 citations67
US11150269B2Oct 19, 2021
Probe head for high frequency signal test and medium or low frequency signal test at the same time
MPI CORP1 citations58
US11402407B2Aug 2, 2022
Positionable probe card and manufacturing method thereof
MPI CORP0 citations54
US12099078B2Sep 24, 2024
Probe card and wafer testing assembly thereof
MPI CORP0 citations47
US9442135B2Sep 13, 2016
Method of manufacturing space transformer for probe card
MPI CORP0 citations33