Inventor
GUPTA ANAND
US69 patents
⚠️ This page may combine multiple inventors who share the name “GUPTA ANAND”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
34 patentsUS6125789AOct 3, 2000
Increasing the sensitivity of an in-situ particle monitor
APPLIED MATERIALS INC564 citations99
US6374770B1Apr 23, 2002
Apparatus for improving film stability of halogen-doped silicon oxide films
APPLIED MATERIALS INC184 citations98
US6191026B1Feb 20, 2001
Method for submicron gap filling on a semiconductor substrate
APPLIED MATERIALS INC155 citations98
US5824375AOct 20, 1998
Decontamination of a plasma reactor using a plasma after a chamber clean
APPLIED MATERIALS INC107 citations98
US6449521B1Sep 10, 2002
Decontamination of a plasma reactor using a plasma after a chamber clean
APPLIED MATERIALS INC59 citations96
US6103601AAug 15, 2000
Method and apparatus for improving film stability of halogen-doped silicon oxide films
APPLIED MATERIALS INC64 citations96
US5494523AFeb 27, 1996
Controlling plasma particulates by contouring the plasma sheath using materials of differing RF impedances
APPLIED MATERIALS INC53 citations96
US5456796AOct 10, 1995
Control of particle generation within a reaction chamber
APPLIED MATERIALS INC68 citations95
US6020035AFeb 1, 2000
Film to tie up loose fluorine in the chamber after a clean process
APPLIED MATERIALS INC74 citations94
US5827785AOct 27, 1998
Method for improving film stability of fluorosilicate glass films
APPLIED MATERIALS INC56 citations94
US5622565AApr 22, 1997
Reduction of contaminant buildup in semiconductor apparatus
APPLIED MATERIALS INC54 citations94
US6638886B1Oct 28, 2003
Plasma fluorine resistant alumina ceramic material and method of making
APPLIED MATERIALS INC19 citations93
US6465043B1Oct 15, 2002
Method and apparatus for reducing particle contamination in a substrate processing chamber
APPLIED MATERIALS INC28 citations93
US6139923AOct 31, 2000
Method and apparatus for reducing particle contamination in a substrate processing chamber
APPLIED MATERIALS INC26 citations93
US6083451AJul 4, 2000
Method of producing a polycrystalline alumina ceramic which is resistant to a fluorine-comprising plasma
APPLIED MATERIALS INC18 citations93
US5608155AMar 4, 1997
Method and apparatus for detecting particles on a substrate
APPLIED MATERIALS INC51 citations93
US5427621AJun 27, 1995
Method for removing particulate contaminants by magnetic field spiking
APPLIED MATERIALS INC36 citations93
US5328555AJul 12, 1994
Reducing particulate contamination during semiconductor device processing
APPLIED MATERIALS INC50 citations93
US5902494AMay 11, 1999
Method and apparatus for reducing particle generation by limiting DC bias spike
APPLIED MATERIALS INC25 citations92
US5423918AJun 13, 1995
Method for reducing particulate contamination during plasma processing of semiconductor devices
APPLIED MATERIALS INC37 citations92
US5410122AApr 25, 1995
Use of electrostatic forces to reduce particle contamination in semiconductor plasma processing chambers
APPLIED MATERIALS INC36 citations92
US6223685B1May 1, 2001
Film to tie up loose fluorine in the chamber after a clean process
APPLIED MATERIALS INC32 citations91
US6214160B1Apr 10, 2001
Method and apparatus for removing particulates from semiconductor substrates in plasma processing chambers
APPLIED MATERIALS INC23 citations91
US5779807AJul 14, 1998
Method and apparatus for removing particulates from semiconductor substrates in plasma processing chambers
APPLIED MATERIALS INC41 citations91
US5622595AApr 22, 1997
Reducing particulate contamination during semiconductor device processing
APPLIED MATERIALS INC32 citations91
US6159333ADec 12, 2000
Substrate processing system configurable for deposition or cleaning
APPLIED MATERIALS INC26 citations90
US5810937ASep 22, 1998
Using ceramic wafer to protect susceptor during cleaning of a processing chamber
APPLIED MATERIALS INC28 citations90
US5083865AJan 28, 1992
Particle monitor system and method
APPLIED MATERIALS INC44 citations90
US6083569AJul 4, 2000
Discharging a wafer after a plasma process for dielectric deposition
APPLIED MATERIALS INC19 citations89
US6001728ADec 14, 1999
Method and apparatus for improving film stability of halogen-doped silicon oxide films
APPLIED MATERIALS INC34 citations89
US6289843B1Sep 18, 2001
Method and apparatus for improving the film quality of plasma enhanced CVD films at the interface
APPLIED MATERIALS INC7 citations73
US6291028B1Sep 18, 2001
Method and apparatus for improving the film quality of plasma enhanced CVD films at the interface
APPLIED MATERIALS INC8 citations73
US6121163ASep 19, 2000
Method and apparatus for improving the film quality of plasma enhanced CVD films at the interface
APPLIED MATERIALS INC10 citations73
US5474640ADec 12, 1995
Apparatus for marking a substrate using ionized gas
APPLIED MATERIALS INC9 citations73
PALANTIR TECHNOLOGIES INC
7 patentsUSD1009056SDec 26, 2023
Display screen or portion thereof with graphical user interface
PALANTIR TECHNOLOGIES INC6 citations83
US10452913B1Oct 22, 2019
Systems and methods for coherent monitoring
PALANTIR TECHNOLOGIES INC13 citations83
US12494027B2Dec 9, 2025
Systems and methods for generating augmented reality content
PALANTIR TECHNOLOGIES INC2 citations74
US10942952B1Mar 9, 2021
Graph analysis of geo-temporal information
PALANTIR TECHNOLOGIES INC2 citations73
US11727317B2Aug 15, 2023
Systems and methods for coherent monitoring
PALANTIR TECHNOLOGIES INC2 citations72
US11222470B1Jan 11, 2022
Systems and methods for generating augmented reality content
PALANTIR TECHNOLOGIES INC4 citations72
US11438672B2Sep 6, 2022
Systems and methods for generating, analyzing, and storing data snippets
PALANTIR TECHNOLOGIES INC2 citations71
SPEEDFAM IPEC CORP
3 patentsREAL TIME METROLOGY INC
1 patentSPEEDFAM CORP
1 patent(unassigned)
1 patentGUPTA ANAND
1 patentCHEUNG HUGO
1 patentDEERE & CO
1 patentShowing the top 50 of 69 patents by PatentIndex Score.